Synchrotron Based Microstructural Characterization Method Development for Pu Oxides

Abstract

Identification of new plutonium oxide signatures is a high priority focus area of the technical nuclear forensics and nonproliferation communities. Comprehensive materials science studies of plutonium oxide are needed to advance the understanding of the microcrystalline properties and their relationship to macro-scale morphologies and signatures. Plutonium oxide particle growth is depenedent on the microcrystalline strucutures, grain size, and orientation. Microcrystalline structures have been found to vary for plutonium oxide based on the oxidation state of plutonium, concentration of reactants, and the physiochemical conditions of precipitation. Empirical observation confirms the relationship between processing conditions and particle morphology. High sensitivity, non destructive analysis of individual microcrystalline grains requires the use of bright sources of X-rays produced by synchrotron radiation, such as those at the Advanced Photon Source. The light source can reveal higher resolution crystallographic mapping, more sensitive chemical analysis, and higher fidelity morphological information than any current methods at SRNL Progress of FY19 was the analysis of the synchrotron data. Areas of focus included XANES oxidation state and EXAFS to measure bond distances with modeling. Most measurements for XANES indicated that the plutonium was in the +4 oxidation state, however, some indicated that there could also be a +5 oxidation state. The EXAFS measurements showed typical Pu – O bonding distance of 2.33 and Pu – Pu bonding distances of 3.81 A; however, some samples also showed that there could be shorter Pu – O distances of approximately 1.81 A, indicative of plutonium in the +5 oxidation state.