Search NASA⌕ Search

DOE OSTI · 1733300

Hardware Evaluation: Abstract Machine Models and Proxy Architectures for Exascale Computing

Abstract

The strategic and economic impacts of high performance computing (HPC) systems, over the last several decades, have enabled dramatic improvements in manufacturing, design, development, and research, across almost every sector of the U.S. economy, including genetic analysis for agriculture and medicine, oil exploration, electronics, aircraft, and automotive design, and of course national defense technologies. HPC has repeatedly compounded reductions in time-to-solution and time-to-market in each of these areas. In recognition of these strategic and economic impacts, the Department of Energy (DOE) created the Exascale Computing Project (ECP) as a broad-based technology project focusing on simultaneously co-evolving high-performance computing architecture, system software, and application software. While many details of the exascale architectures are undefined, communicating the form and direction of this co-evolution of advances, in each of these three components, across the project, presents a need for a common language through which these advances can be shared. In this document we present a series of abstract representations designed to allow application developers to focus on the aspects of the machine that are important or relevant to performance and code structure. These abstract machine models (AMMs) describe the proposed architectures at the component and system level and are intended as communication aids between application developers and hardware architects during the co-design process. In addition to providing a common language for communication, the constraints of protecting the intellectual property of ECP’s vendor partners requires that the architectural advances be presented in an abstract sense, rather than exposing the specifics of an individual vendor’s designs, while still providing enough detail such that application developers will be able to reason about the performance trade-offs in the design space of their applications.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Bair, Ray, Chien, Andrew, Cook, Jeanine, Donofrio, Dave, Grider, Gary, Kuehn, Jeff, Moore, Shirley, Shalf, John, Vetter, Jeff. 2018-02-01. Hardware Evaluation: Abstract Machine Models and Proxy Architectures for Exascale Computing. https://doi.org/10.2172/1733300

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

TANTE: Time-adaptive operator learning via neural Taylor expansion

Operator learning for time-dependent partial differential equations (PDEs) has seen rapid progress in recent years, enabling efficient approximation of complex spatiotemporal dynamics. However, most existing methods rely on fixed time step sizes during rollout, which limits their ability to adapt to varying temporal complexity and often leads to error accumulation. In this work, we propose the Time-Adaptive Transformer with Neural Taylor Expansion (TANTE), a novel operator-learning framework that produces continuous-time predictions with adaptive step sizes. TANTE predicts future states by performing a Taylor expansion at the current state, where neural networks learn both the higher-order temporal derivatives and the local radius of convergence. This allows the model to dynamically adjust its rollout based on the local behavior of the solution, thereby reducing cumulative error and improving computational efficiency. We demonstrate the effectiveness of TANTE across a wide range of PDE benchmarks, achieving superior accuracy and adaptability compared to fixed-step baselines, delivering accuracy gains of 60-80 % and speed-ups of 30-40 % at inference time.

97 MATHEMATICS AND COMPUTING↗

Structured illumination for surface-resolved grazing-incidence X-ray scattering

Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.

97 MATHEMATICS AND COMPUTING↗