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DOE OSTI · 1808860

Quantitative order-parameter measurement in lattice-mismatched AlInP using precession electron diffraction

Pasala, Xavier·Pokharel, Nikhil·Ahrenkiel, Phil·Alberi, Kirstin·Forghani, Kamran·Stender, Chris
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Abstract

Precession electron diffraction (PED) was used to measure the long-range order parameter in lattice-mismatched AlInP epitaxial films under investigation for solid-state-lighting applications. Both double- and single-variant films grown at 620, 650, and 680°C were analyzed in TEM cross-section. PED patterns were acquired in selected-area-diffraction mode through external microscope control using serial acquisition, which allows inline image processing. The integrated peak intensities from experimental patterns were fit using dynamical simulations of diffraction from the ordered domain structures. Included in the structure-factor calculations were mean atomic displacements of the anions (P) due to ordering, which were found by valence-force-field calculations to have a nearly linear dependence on order parameter. A maximum order parameter of S = 0.36 was measured for a double-variant specimen grown at 650°C.

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77 NANOSCIENCE AND NANOTECHNOLOGYatomic orderinglight emitting diodesprecession electron diffractionsemiconductorssolid-state lightingtransmission electron microscopy

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Pasala, Xavier, Pokharel, Nikhil, Ahrenkiel, Phil, Alberi, Kirstin, Forghani, Kamran, Stender, Chris. 2021-07-05. Quantitative order-parameter measurement in lattice-mismatched AlInP using precession electron diffraction. https://doi.org/10.1111/jmi.13047

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