DOE OSTI · 1812458
FPGA Reliability Test Design Using Parametric Degradation Analysis.
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Ozment, Seth James, Leonhardt, Darin, Grzybowski, Thomas Anthony, Fellows, Matthew Ward. 2020-08-01. FPGA Reliability Test Design Using Parametric Degradation Analysis.. https://www.osti.gov/biblio/1812458
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