DOE OSTI · 1821971
Thermal Infrared Detectors: expanding performance limits using ultrafast electron microscopy
Abstract
This project aimed to identify the performance-limiting mechanisms in mid- to far infrared (IR) sensors by probing photogenerated free carrier dynamics in model detector materials using scanning ultrafast electron microscopy (SUEM). SUEM is a recently developed method based on using ultrafast electron pulses in combination with optical excitations in a pump- probe configuration to examine charge dynamics with high spatial and temporal resolution and without the need for microfabrication. Five material systems were examined using SUEM in this project: polycrystalline lead zirconium titanate (a pyroelectric), polycrystalline vanadium dioxide (a bolometric material), GaAs (near IR), InAs (mid IR), and Si/SiO 2 system as a prototypical system for interface charge dynamics. The report provides detailed results for the Si/SiO 2 and the lead zirconium titanate systems.
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Talin, Albert, Ellis, Scott, Bartelt, Norman, Leonard, Francois Leonard, Perez, Christopher, Celio, Km, Fuller, Elliot, Hughart, David, Garland, Diana, Marinella, Matthew, Michael, Joseph Richard, Chandler, David, Young, Steve, Smith, Sean, Kumar, Suhas. 2021-09-01. Thermal Infrared Detectors: expanding performance limits using ultrafast electron microscopy. https://doi.org/10.2172/1821971
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