DOE OSTI · 1840017
IRIXS Spectrograph: an ultra high-resolution spectrometer for tender RIXS
Abstract
The IRIXS Spectrograph represents a new design of an ultra-high-resolution resonant inelastic X-ray scattering (RIXS) spectrometer that operates at the Ru L 3 -edge (2840 eV). First proposed in the field of hard X-rays by Shvyd'ko [(2015), Phys. Rev. A, 91, 053817], the X-ray spectrograph uses a combination of laterally graded multilayer mirrors and collimating/dispersing Ge(111) crystals optics in a novel spectral imaging approach to overcome the energy resolution limitation of a traditional Rowland-type spectrometer [Gretarsson et al. (2020), J. Synchrotron Rad. 27, 538–544]. In combination with a dispersionless nested four-bounce high-resolution monochromator design that utilizes Si(111) and Al 2 O 3 (110) crystals, an overall energy resolution better than 35 meV full width at half-maximum has been achieved at the Ru L 3 -edge, in excellent agreement with ray-tracing simulations.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Bertinshaw, Joel, Mayer, Simon, Dill, Frank-Uwe, Suzuki, Hakuto, Leupold, Olaf, Jafari, Atefeh, Sergueev, Ilya, Spiwek, Manfred, Said, Ayman, Kasman, Elina, Huang, Xianrong, Keimer, Bernhard, Gretarsson, Hlynur. 2021-05-27. IRIXS Spectrograph: an ultra high-resolution spectrometer for tender RIXS. https://doi.org/10.1107/s1600577521003805
Cite the original work for its findings. Save a collection to share your selection of sources.