DOE OSTI · 1847216
Single Event Burnout in Vertical GaN Diodes.
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Martinez, Marino, Colon, Albert, Kropka, Kimberly E, Neely, Jason C., Pickrell, Gregory. 2021-02-01. Single Event Burnout in Vertical GaN Diodes.. https://www.osti.gov/biblio/1847216
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