DOE OSTI · 1854316
Extraction of Data-Driven Compact Models from High-Fidelity Semiconductor Simulations with Topological Data Analysis.
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Huang, Andy, Trask, Nathaniel Albert, Gao, Xujiao, Reza, Shahed, Wilcox, Ian Zachary, Diaz, Candace Pauline. 2021-03-01. Extraction of Data-Driven Compact Models from High-Fidelity Semiconductor Simulations with Topological Data Analysis.. https://doi.org/10.2172/1854316
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