Sub-surface imaging of atomically-thin semiconductors beneath dielectrics based on optical standing wave using photoelectron emission microscopy with deep-ultraviolet photoexcitation .

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Ohta, Taisuke, Berg, Morgann, Liu, Angeline, Smith, Sean, Copeland, Robert, Chan, Calvin, Mohite, A. D, Beechem, T. E.. 2021-10-01. Sub-surface imaging of atomically-thin semiconductors beneath dielectrics based on optical standing wave using photoelectron emission microscopy with deep-ultraviolet photoexcitation .. https://doi.org/10.2172/1891974

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