Spectral gratings-based phase-contrast imaging for materials characterization

Abstract

Spectral X-ray detectors provide a direct observation of the energy spectrum of a transmitted X-ray beam, both for typical and phase-contrast gratings-based systems. The sensitivity of a gratings-based X-ray system to small-angle deflections from a given particle size is dependent on X-ray energy. Therefore, spectral (energy-sensitive) detectors could be sensitive to particle size, even with a broad spectrum from a commercial X-ray generator. Furthermore, these detectors allow direct observation of how the X-ray spectrum is changing as the beam is passing through an object and gratings, and how this affects grating visibilities used to determine the presence of small-angle deflections. This is a particular issue for higher-energy systems where artifacts from beam hardening are common. We present results exploring the particle-size dependent signatures that are available from a spectral gratings-based phase-contrast X-ray imaging system, and the feasibility of observing them with lab-based, broad-spectrum X-ray generators.