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DOE OSTI · 2004391

Ionization and displacement damage effects in high voltage vertical GaN diodes.

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Vizkelethy, Gyorgy, Wampler, William, Armstrong, Andrew, Pickrell, Gregory, Gunning, B. P, Kropka, Kimberly. 2022-08-01. Ionization and displacement damage effects in high voltage vertical GaN diodes.. https://doi.org/10.2172/2004391

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