Exploring thermal, mechanical, and electrical shock via in-situ electron microscopy.

Lang, Eric; Schoell, Ryan; Madden, Nathan; Small, Kathryn; Hattar, Khalid

doi:10.2172/2005708

DOE OSTI · 2005708

Exploring thermal, mechanical, and electrical shock via in-situ electron microscopy.

Lang, Eric·Schoell, Ryan·Madden, Nathan·Small, Kathryn·Hattar, Khalid

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Lang, Eric, Schoell, Ryan, Madden, Nathan, Small, Kathryn, Hattar, Khalid. 2022-10-01. Exploring thermal, mechanical, and electrical shock via in-situ electron microscopy.. https://doi.org/10.2172/2005708

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