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DOE OSTI · 22494401

Hard x-ray nanofocusing using total-reflection zone plates

Takano, Hidekazu·Matsumura, Atsuyuki·Sakka, Kenji·Tsusaka, Yoshiyuki·Kagoshima, Yasushi·Tsuji, Takuya
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Abstract

A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.

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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICSCOMPARATIVE EVALUATIONSDIFFRACTIONEFFICIENCYFOCUSINGGRATINGSHARD X RADIATIONKEV RANGE 01-10PLATESREFLECTIONSYNCHROTRON RADIATION

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Takano, Hidekazu, Matsumura, Atsuyuki, Sakka, Kenji, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Tsuji, Takuya. 2016-01-28. Hard x-ray nanofocusing using total-reflection zone plates. https://doi.org/10.1063/1.4937533

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