DOE OSTI · 22922892
Characterizing the Josephson Effect on Ba-122 Single-Crystal Junctions
Abstract
This paper presents c-direction hybrid Josephson junctions with base electrodes of Co:BaFe{sub 2}As{sub 2} single crystals. To realize Josephson junctions, it applies standard photolithography technologies and a newly developed surface polishing method that was used. As conventional isotropic s-wave superconductor counter electrodes used double layers of Pb/In. The artificial barrier for the tunneling junctions consists of a thin sputtered Ti layer or a thermally evaporated Al layer; both layers were used as an insulator barrier. For characterizing the Josephson effects with TiO{sub x} barrier, we could realize I{sub c}R{sub N} products of about 13.7 μV and unconventional I{sub c}-T dependencies. The formation of Shapiro steps under the influence of microwave irradiation and magnetic field to the junctions will be discussed as well.
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Reifert, D., Schmidt, S., Schmidl, F., Tympel, V., Wolf, T.. 2019-09-15. Characterizing the Josephson Effect on Ba-122 Single-Crystal Junctions. https://doi.org/10.1007/s10948-019-5033-4
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