DOE OSTI · 2431756
Gate insertions scale noise tractably for zero noise extrapolation on a trapped ion device
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Maupin, Oliver, Love, Peter J., Burch, Ashlyn Damaris, Landahl, Andrew J., Clark, Susan M.. 2023-03-01. Gate insertions scale noise tractably for zero noise extrapolation on a trapped ion device. https://doi.org/10.2172/2431756
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