DOE OSTI · 2477741
Optical Modeling of Polysilicon: TOPCon PV
Abstract
Determine how film thickness changes with different deposition methods. Analyze relationship between film thickness and optical constants. The deposition rate of intrinsic polysilicon is higher during initial deposition then begins to slow down as deposition time increases. Longer depositions of polysilicon are more crystalline in structure than shorter depositions. N-type doping of polysilicon is more crystalline in structure than p-type doping, despite similar film thicknesses.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Roos, Arihana, Rada, Eric, Nemeth, William, Young, David, Stoke, Jason. 2024-11-12. Optical Modeling of Polysilicon: TOPCon PV. https://www.osti.gov/biblio/2477741
Cite the original work for its findings. Save a collection to share your selection of sources.