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DOE OSTI · 2477741

Optical Modeling of Polysilicon: TOPCon PV

Abstract

Determine how film thickness changes with different deposition methods. Analyze relationship between film thickness and optical constants. The deposition rate of intrinsic polysilicon is higher during initial deposition then begins to slow down as deposition time increases. Longer depositions of polysilicon are more crystalline in structure than shorter depositions. N-type doping of polysilicon is more crystalline in structure than p-type doping, despite similar film thicknesses.

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BibTeXRIS

Roos, Arihana, Rada, Eric, Nemeth, William, Young, David, Stoke, Jason. 2024-11-12. Optical Modeling of Polysilicon: TOPCon PV. https://www.osti.gov/biblio/2477741

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