Identifying, quantifying, and mitigating background with the time-resolved x-ray diffraction platform at NIF

Benedetti, L R; Palmer, N E; Vennari, C E; Nyholm, P R; Eggert, J E; Carpenter, A C; Bhandarkar, N; Bradley, D K; MacKinnon, A J; Nagel, S R; Ping, Y; Stan, C V; Trosseille, C

DOE OSTI · 2477901

Identifying, quantifying, and mitigating background with the time-resolved x-ray diffraction platform at NIF

Benedetti, L R·Palmer, N E·Vennari, C E·Nyholm, P R·Eggert, J E·Carpenter, A C·Bhandarkar, N·Bradley, D K·MacKinnon, A J·Nagel, S R·Ping, Y·Stan, C V·Trosseille, C

View original source ↗Read source document ↗Export metadata ↓

Abstract

The source did not provide an abstract. Follow the original record for more information.

Explore related subjects

Engineering - Other instrumentation, Physics - Plasma physics , Physics - Condensed matter physics

Keep this discovery

Explore connections, maps & timelines

BibTeX RIS

Benedetti, L R, Palmer, N E, Vennari, C E, Nyholm, P R, Eggert, J E, Carpenter, A C, Bhandarkar, N, Bradley, D K, MacKinnon, A J, Nagel, S R, Ping, Y, Stan, C V, Trosseille, C. 2024-11-14. Identifying, quantifying, and mitigating background with the time-resolved x-ray diffraction platform at NIF. https://www.osti.gov/biblio/2477901

Cite the original work for its findings. Save a collection to share your selection of sources.