TiltEM User Manual

Abstract

The ability to automate the scanning transmission electron microscope (S/TEM) is tantamount to addressing next generation artificial intelligence, machine learning, and materials modeling capabilities. Constant utilization of these high-end capital equipment purchases also serves the requirements of the Department of Energy (DOE) to be fiscally responsible to the public. The development of an automated multi-modal tilt series algorithm for dark field/bright field S/TEM imaging plus chemical identification with energy dispersive x-ray spectroscopy has been achieved at PNNL. A tilt series workflow has now been generated which allows for autonomous collection of imaging and compositional information simultaneously. This advancement is due in large part to a transition from the rigid and microscope specific JEOL hardware environment, to the more adaptable GMS environment. This has thereby led to a greater degree of flexibility in the application of this method across platforms in addition to substantial time savings to the user.