DOE OSTI · 2500270
Multiple origins of extra electron diffractions in fcc metals
Abstract
Diffuse intensities in the electron diffraction patterns of concentrated face-centered cubic solid solutions have been widely attributed to chemical short-range order, although this connection has been recently questioned. This article explores the many nonordering origins of commonly reported features using a combination of experimental electron microscopy and multislice diffraction simulations, which suggest that diffuse intensities largely represent thermal and static displacement scattering. A number of observations may reflect additional contributions from planar defects, surface terminations incommensurate with bulk periodicity, or weaker dynamical effects.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Walsh, Flynn, Zhang, Mingwei, Ritchie, Robert O., Asta, Mark, Minor, Andrew M.. 2024-08-02. Multiple origins of extra electron diffractions in fcc metals. https://doi.org/10.1126/sciadv.adn9673
Cite the original work for its findings. Save a collection to share your selection of sources.