DOE OSTI · 2540367
Using ground state and excited state DFTto decipher 3d dopant defects in GaN
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Schultz, Peter Andrew, Lutz, Jesse James. 2024-03-01. Using ground state and excited state DFTto decipher 3d dopant defects in GaN. https://www.osti.gov/biblio/2540367
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