Scientific exploration with expert knowledge (SEEK) in autonomous scanning probe microscopy with active learning

Pratiush, Utkarsh [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA] (ORCID:000900037249103X); Funakubo, Hiroshi [Department of Materials Science and Engineering, Tokyo Institute of Technology, Yokohama, 226-8502, Japan]; Vasudevan, Rama [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA] (ORCID:0000000346928579); Kalinin, Sergei V. [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA, Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99354, USA]; Liu, Yongtao [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA]

doi:10.1039/d4dd00277f

DOE OSTI · 2561455

Scientific exploration with expert knowledge (SEEK) in autonomous scanning probe microscopy with active learning

Pratiush, Utkarsh [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA] (ORCID:000900037249103X)·Funakubo, Hiroshi [Department of Materials Science and Engineering, Tokyo Institute of Technology, Yokohama, 226-8502, Japan]·Vasudevan, Rama [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA] (ORCID:0000000346928579)·Kalinin, Sergei V. [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA, Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99354, USA]·Liu, Yongtao [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA]

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Abstract

This work introduces a knowledge-informed framework that integrates human expertise and prior interest into active learning-driven autonomous experimentation, which enhances the exploration efficiency through more targeted experimentation.

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Pratiush, Utkarsh [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA] (ORCID:000900037249103X), Funakubo, Hiroshi [Department of Materials Science and Engineering, Tokyo Institute of Technology, Yokohama, 226-8502, Japan], Vasudevan, Rama [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA] (ORCID:0000000346928579), Kalinin, Sergei V. [Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, Tennessee 37996, USA, Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99354, USA], Liu, Yongtao [Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA]. 2025-01-15. Scientific exploration with expert knowledge (SEEK) in autonomous scanning probe microscopy with active learning. https://doi.org/10.1039/d4dd00277f

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