Quantifying Pore Morphology in Spray-Formed Tantalum Using X-ray Micro-computed Tomography

Abstract

In order to establish quantitative process–structure–property relationships in thermal spray coatings, a robust framework for defining (micro)structural characteristics is needed. Here, we present a quantitative characterization of the three-dimensional morphology of porosity in spray-formed tantalum samples based on high-resolution X-ray micro-computed tomography. Using synchrotron facilities, we acquired dozens of high-resolution scans, enabling a statistically meaningful comparison across multiple samples, different regions within samples, and spray processes. We quantify the spatial distribution, size, and topology of porous inclusions, with a significant focus on variability across samples and different spray processes (plasma and cold sprayed), as well as sensitivity to image segmentation and resolution. Based on a typical segmentation, we report porosities ranging from 0.9 to 1.7 pct for all samples tested, with significant sensitivity due to image segmentation resulting in estimates as low as 0.6 pct and as high as 4.8 pct. For the complex pore space morphology observed in these materials, we argue that a conventional analysis based on identifying individual pores is not well suited, and propose an alternative approach based on morphological metrics with a rich history in porous media literature, such as spatial correlations, local pore thickness, and scale-dependent sub-sampling. Spatial correlations indicate anisotropic splat structures, but only mildly anisotropic pores. Various measures of pore size show a wide distribution of sizes, ranging from sub-micron to 10-micron length scales. Scale-dependent variations in porosity suggest that representative volumes of several hundred microns are required for convergence of morphological metrics, with larger volumes for cold-spray materials. This work provides a robust quantitative basis for describing three-dimensional pore structure in thermal spray coatings.