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DOE OSTI · 2570774

Spotlight: efficient automated global optimization in rietveld analysis of diffraction data

Abstract

Performing reliable Rietveld analysis on tens or hundreds of powder diffraction datasets from parametric or time-resolved experiments often poses a bottleneck in extracting meaningful results from the data. While automated analysis of data has recently been demonstrated, high temperature annealing studies, during which phase transformations occur and lattice parameters may change due to repartitioning of elements, are prime examples where automation by a simple phase identification from a database of room temperature structures or automation by sequential refinements is likely to fail. To enable reliable, efficient, automated Rietveld analysis, we present a Python package named Spotlight , building on established Rietveld packages such as MAUD, GSAS , or GSAS-II , which extends the refinement of best fit parameters to a global optimization using an ensemble of optimizers leveraging hierarchical parallel execution on high-performance computing clusters. Spotlight further enables the efficient design of refinement plans through the iterative automated machine-learning of a surrogate for the refinement on which the global optimizations are performed until results from the surrogate converge to the response surface data. We demonstrate Spotlight with the analysis of uranium molybdenum and Ti–6Al–4V datasets, as well as in two open-source tutorials analyzing aluminium oxide and lead sulphate.

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BibTeXRIS

Biwer, Christopher M. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)], Feng, Zhenxing [Univ. of New Hampshire, Durham, NH (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)], Finstad, Daniel [Syracuse Univ., NY (United States)], McDonnell, Marshall [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000237132117), Knezevic, Marko [Univ. of New Hampshire, Durham, NH (United States)], McKerns, Michael [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States); Uncertainty Quantification Foundation, Wilmington, DE (United States)] (ORCID:0000000183423778), Savage, Daniel J. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000199732030), Vogel, Sven C. [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)] (ORCID:0000000320490361). 2025-03-11. Spotlight: efficient automated global optimization in rietveld analysis of diffraction data. https://doi.org/10.1038/s41598-025-92452-4

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36 MATERIALS SCIENCE