DOE OSTI · 2999352
Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multiperspective microscopy
Abstract
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Fabian pena, Luis, Koepke, Justine Chava, Dycus, J. Houston, Mounce, Andrew, Baczewski, Andrew David, Jacobson, Noah Tobias, Bussmann, Ezra. 2024-11-01. Modeling Si/SiGe quantum dot variability induced by interface disorder reconstructed from multiperspective microscopy. https://doi.org/10.2172/2999352
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