DOE OSTI · 3000640
Transport Enabled Gates with Integrated Photonics on a Surface Electrode Ion Trap
Abstract
The source did not provide an abstract. Follow the original record for more information.
Keep this discovery
Explore connections, maps & timelines
Hogle, Craig William, Sterk, Jonathan David, Stick, Daniel Lynn. 2024-10-01. Transport Enabled Gates with Integrated Photonics on a Surface Electrode Ion Trap. https://doi.org/10.2172/3000640
Cite the original work for its findings. Save a collection to share your selection of sources.