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DOE OSTI · 3002152

Multimodal Atomic Force Microscopy for the Characterization of Metallic Particulates

Abstract

This study investigates the utility of multimodal, or functional, atomic force microscopy (AFM) for the characterization of individual particles and particle ensembles. In single-particle analyses, AFM imaging modes provided orthogonal insights into mechanical and magnetic properties that are not accessible through conventional electron microscopy. Although the experiments were inherently delicate and time-intensive, with an observed sample loss rate of approximately 30%, these techniques enabled the qualitative differentiation of grain structures and magnetic domains, underscoring the challenges of experimental robustness. For particle ensembles, AFM enabled the extraction of reliable 2D and 3D particle size distributions. However, efforts to chemically differentiate particles based on mechanical property contrasts were limited by scaling effects and the qualitative nature of the data. Overall, multimodal AFM offers valuable complementary information, but its application requires careful consideration of methodological limitations, particularly for sample integrity, calibration, and scalability of mechanical and magnetic measurements. This report is organized to first address the application of AFM to single-particle analysis using various imaging modalities, followed by its potential role in ensemble-level particle screening and differentiation.

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BibTeXRIS

Neu, Jenn [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000034392349X), Wood, Avery [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000224919228), Moseley, Duncan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000343518347), Parish, Chad [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000312097439), Miskowiec, Andrew [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000203612614), Brubaker, Zach [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000256293119). 2025-10-01. Multimodal Atomic Force Microscopy for the Characterization of Metallic Particulates. https://doi.org/10.2172/3002152

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36 MATERIALS SCIENCE↗