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DOE OSTI · 3002240

Feasibility Assessment of Using Electrical Impedance Tomography for Damage Localization in Graphite Microreactor Components

Abstract

Microreactors have great potential to decrease capital costs and construction timelines, reducing the barriers to implementing advanced nuclear reactor technologies. However, the lower power output of these microreactors introduces economic challenges if the operation and maintenance costs cannot be reduced sufficiently. Many microreactor concepts use graphite materials for in-core moderator and structural purposes, which will require periodic inspection or, ideally, in situ structural health monitoring. This work describes an initial evaluation of the feasibility of leveraging graphite’s semiconducting properties to perform electrical impedance tomography (EIT) for defect localization. First, a study was performed to identify the best methods for bonding electrical contacts to minimize the effects of contact resistance that interfere with impedance measurements of the graphite. After determining the best bonding approach, electrodes were attached to multiple graphite components with varying geometries (e.g., simple block and more representative microreactor hexagonal block). In parallel, finite element analysis approaches were developed and implemented to analyze the impact of defects and contact resistances and to inform an iterative inverse model for reconstructing the conductivity distribution. The results of this study show that defect localization in graphite components is possible using EIT if a sufficient number of electrodes (to improve spatial resolution) can be bonded using a technique with very low contact resistance and those contact resistances remain stable during reactor operation. If the reactor core and vessel design do not allow electrodes to be bonded during reactor operation, then it may be possible to detach/reattach electrodes between reactor operation and outages if a suitable mechanical connection that offers repeatable contact resistance can be identified. Alternatively, future work could focus on identifying contacts that can survive the harsh reactor operating environment so that contacts do not need to be removed.

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Raj, Anant [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000306711244), Schreiber, Brandon [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000903896336), Ramuhalli, Pradeep [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000163721743), Petrie, Christian M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000311673545). 2025-08-01. Feasibility Assessment of Using Electrical Impedance Tomography for Damage Localization in Graphite Microreactor Components. https://doi.org/10.2172/3002240

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