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DOE OSTI · 3002622

High-Throughput Characterization Tools/Algorithms To Outline Porosity Variability in AM Samples as a Function of Processing Conditions

Ziabari, Amir [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000034776457X)·Rahman, Obaid [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000277810840)·Sprayberry, Michael [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000215157946)·Franklin, Rahul [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000232662362)·Peles, Amra [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]·Hyer, Holden [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000343915561)·Joslin, Chase [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000246246511)·Graham, Sarah [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]·Schmitt, Elizabeth [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]·Nandwana, Peeyush [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000251471668)·Massey, Caleb [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]·Kishor morankar, Swapnil [Idaho National Laboratory (INL), Idaho Falls, ID (United States)]·Chuirazzi, William Christopher [Idaho National Laboratory (INL), Idaho Falls, ID (United States)]·Zhang, Xuan [Argonne National Laboratory (ANL), Argonne, IL (United States)]·Dryepondt, Sebastien [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000312651612)·Plotkowski, Alex [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000154718681)·Dehoff, Ryan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000194569633)
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Abstract

This report documents the development and deployment of advanced algorithms and tools that enable high-throughput characterization for metal additive manufacturing (AM), with a particular focus on process parameter optimization and material/part qualification for nuclear applications. While the method ologies presented support diverse characterization techniques, the majority of the work is centered on AI-driven algorithms for X-ray computed tomography (XCT) to accelerate defect detection and materials analysis at scale.

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Ziabari, Amir [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000034776457X), Rahman, Obaid [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000277810840), Sprayberry, Michael [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000215157946), Franklin, Rahul [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000232662362), Peles, Amra [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Hyer, Holden [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000343915561), Joslin, Chase [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000246246511), Graham, Sarah [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Schmitt, Elizabeth [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Nandwana, Peeyush [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000251471668), Massey, Caleb [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Kishor morankar, Swapnil [Idaho National Laboratory (INL), Idaho Falls, ID (United States)], Chuirazzi, William Christopher [Idaho National Laboratory (INL), Idaho Falls, ID (United States)], Zhang, Xuan [Argonne National Laboratory (ANL), Argonne, IL (United States)], Dryepondt, Sebastien [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000312651612), Plotkowski, Alex [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000154718681), Dehoff, Ryan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000194569633). 2025-02-01. High-Throughput Characterization Tools/Algorithms To Outline Porosity Variability in AM Samples as a Function of Processing Conditions. https://doi.org/10.2172/3002622

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