DOE OSTI · 3002631
Elucidating Processes at Hard-Soft Interfaces in Next-Generation Electrochemical Devices by Cryogenic Electron Microscopy
Abstract
The source did not provide an abstract. Follow the original record for more information.
Keep this discovery
Explore connections, maps & timelines
Zachman, Michael [ORNL] (ORCID:0000000319101357), Oh, Juhyun [ORNL] (ORCID:0000000286051428), Cullen, David A [ORNL] (ORCID:0000000225937866), Sahore, Ritu [ORNL] (ORCID:0000000223909570), Chen, Xi [ORNL] (ORCID:0000000311887658), Wang, Xiaoping [Argonne National Laboratory (ANL)], Myers, Deborah [Argonne National Laboratory (ANL)], Ushizima, Daniela [Lawrence Berkeley National Laboratory (LBNL)], Kwon, Obeen [University of California, Irvine], Zenyuk, Iryna [University of California, Irvine]. 2025-07-01. Elucidating Processes at Hard-Soft Interfaces in Next-Generation Electrochemical Devices by Cryogenic Electron Microscopy. https://doi.org/10.1093/mam%2Fozaf048.654
Cite the original work for its findings. Save a collection to share your selection of sources.