DOE OSTI · 3029784
Model Risk Assessment for an Electromagnetic Application
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Neal, Kyle Daniel [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000178801498), Krueger, Aaron Martin [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000000032228406X), Pack, Alden Roy [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)], Karve, Pranav M. [Vanderbilt University], Mahadevan, Sankaran [Vanderbilt University], Mullins, Joshua Grady [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0009000358078783). 2025-04-01. Model Risk Assessment for an Electromagnetic Application. https://doi.org/10.2172/3029784
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