DOE OSTI · 3367068
Autonomous fabrication of tailored defect structures in 2D materials using machine learning-enabled scanning transmission electron microscopy
Abstract
Materials with tailored quantum properties can be engineered from atomic-scale assembly techniques, but existing methods often lack the agility and accuracy to precisely and intelligently control the manufacturing process. Here, we demonstrate a fully autonomous approach for fabricating atomic-level defects using electron beams in scanning transmission electron microscopy (STEM) that combines advanced machine learning and automated beam control. As a proof of concept, we achieved controlled fabrication of MoS-nanowire (MoS-NW) edge structures by iterative and targeted exposure of MoS 2 monolayer to a focused electron beam to selectively eject sulfur atoms, utilizing high-angle annular dark-field (HAADF) imaging for feedback-controlled monitoring of structural evolution of defects. A machine learning framework combining a random forest model and a convolutional neural network (CNN) was developed to decode the HAADF image and accurately identify atomic positions and species. This atomic-level information was then integrated into an autonomous decision-making platform, which applied predefined fabrication strategies to instruct beam control about atomic sites to be ejected. The selected sites were subsequently exposed to a localized electron beam using an FPGA-controlled scan routine with precise control over beam positioning and duration. While the MoS-NW edge structures produced exhibit promising mechanical and electronic properties, the proposed methods to build the autonomous fabrication framework is material-agnostic and can be extended to other 2D materials for the creation of diverse defect structures and heterostructures beyond Mo S2 .
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Wu, Zijie [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Roccapriore, Kevin M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); AtomQ, Knoxville, TN (United States)], Ghosh, Ayana [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Xiao, Kai [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Unocic, Raymond R. [North Carolina State University, Raleigh, NC (United States)], Jesse, Stephen [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Vasudevan, Rama K. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)], Boebinger, Matthew G. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000196222043). 2026-04-27. Autonomous fabrication of tailored defect structures in 2D materials using machine learning-enabled scanning transmission electron microscopy. https://doi.org/10.1038/s41524-026-02025-w
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