DOE OSTI · 3385132
Secondary Electron plume imaging and applications for mapping electric fields
Abstract
Presentation on usage of our SEM 'plume imaging' technique for studying interfacial dynamics between molybdenum disulfide and lanthanum cobaltite. To be presented at Microscopy and Microanalysis Conference.
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Alcorn, Francis Marion [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:000000022413704X), Perez, Christopher [Stanford University], Smoll, Eric James [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000319554671), Ghosal, Debjit [NREL], Salagre Rubio, Elena [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000196729987), Blackburn, Jeffrey L. [NREL], Kumar, Suhas [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)], Chandler, David W. [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:0000000320762507), Talin, Albert Alec [Sandia National Laboratories (SNL-CA), Livermore, CA (United States)] (ORCID:000000021102680X). 2025-07-01. Secondary Electron plume imaging and applications for mapping electric fields. https://doi.org/10.2172/3385132
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