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DOE OSTI · 3632818

Semi-Dynamic Leach Testing of Densified Silicon-based Iodine Waste Forms

Abstract

Iodine waste forms (IWF) require a conceptual corrosion release model (CCRM) to provide iodine (I) release rates for performance modeling nuclear waste disposal repositories. To develop a CCRM, an understanding of the corrosion mechanisms of the IWF are required along with data from consistent test methods to parameterize the model. The present study has advanced both areas by providing and assessing the corrosion resistance of IWF types based on their processing history in minor variations of semi-dynamic leach tests. The test included a series of semi-dynamic leach tests using monolithic IWFs in deionized water (leachant). Several experiments were conducted under alternate test conditions with changes to temperature, leachant replacement, leachant pH, leachant volume, masking, and surface finish to elucidate if varying these conditions impacted IWF corrosion behavior. Tests were conducted on two classes of IWFs: (1) I-bearing silver-mordenite (AgZ) materials processed by hot isostatic pressing (HIP) at different temperatures, pressures, sizes, and times; and (2) I-bearing silver-functionalized silica aerogels (SFA) processed by either HIP or spark plasma sintering (SPS). The corrosion susceptibility of AgZ samples was influenced by HIP temperature and pressure. The SPS SFAs retained I far better than HIP SFAs. Additional findings in this study include: (1) The iodine dissolution rate decreased with decreasing temperature, (2) a common ion effect may occur and slow dissolution of the host phase if the leachant is not regularly replaced, (3) pH controls the dissolution rate, and (4) the iodine dissolution rate slows with extended test time (up to 224 days). Based on this work, these parameters should thus be represented when developing a CCRM.

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BibTeXRIS

Lawter, Amanda R., Clark, Gemma G. (ORCID:0000000246794075), Escobedo Avalos, Nancy M. (ORCID:0000000180734642), Bonnett, Jeff F., Canfield, Nathan L., Choi, Seungrag, Bowden, Mark E., Matyas, Josef, Asmussen, Robert M. (ORCID:0000000159777728). 2026-04-17. Semi-Dynamic Leach Testing of Densified Silicon-based Iodine Waste Forms. https://doi.org/10.1039/d6ra01079b

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