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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 181 records · Page 10

Absolute optical metrology : nanometers to kilometers

We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.

optical metrology↗

Sub-nanometer Level Model Validation of the SIM Interferometer

The Space Interferometer Mission (SIM) flight instrument will not undergo a full performance, end-to-end system test on the ground due to a number of constraints. Thus, analysis and physics-based models will play a significant role in providing confidence that SIM will meet its science goals on orbit. The various models themselves are validated against the experimental results obtained from the MicroArcsecond Metrology (MAM) testbed adn the Diffraction testbed (DTB). The metric for validation is provided by the SIM astrometric error budget.

modeling↗

Thermoelectric device with multiple, nanometer scale, elements

A thermoelectric device formed of nanowires on the nm scale. The nanowires are preferably of a size that causes quantum confinement effects within the wires. The wires are connected together into a bundle to increase the power density.

Fleurial, Jean-Pierre↗

Interferometric Testbed for Nanometer Level Stabilization of Environmental Motion Over Long Timescales

We developed an interferometric testbed to stabilize environmental motions over timescales of several hours and a lengthscale of 1m. Typically, thermal and seismic motions on the ground are larger than 1 micron over these scales, affecting the precision of more sensitive measurements. To suppress such motions, we built an active stabilization system composed of interferometric sensors, a hexapod actuator, and a frequency stabilized laser. With this stabilized testbed, environmental motions were suppressed down to nm level. This system will allow us to perform sensitive measurements, such as ground testing of LISA (Laser Interferometer Space Antenna), in the presence of environmental noise.

Numata, Kenji↗

Deep Metastable Eutectic Nanometer-Scale Particles in the MgO-Al2O3-SiO2 System

Laboratory vapor phase condensation experiments systematically yield amorphous, homogeneous, nanoparticles with unique deep metastable eutectic compositions. They formed during the nucleation stage in rapidly cooling vapor systems. These nanoparticles evidence the complexity of the nucleation stage. Similar complex behavior may occur during the nucleation stage in quenched-melt laboratory experiments. Because of the bulk size of the quenched system many of such deep metastable eutectic nanodomains will anneal and adjust to local equilibrium but some will persist metastably depending on the time-temperature regime and melt/glass transformation.

Reitmeijer, Frans J. M.↗

Lateral Variations in Lunar Weathering Patina on Centimeter to Nanometer Scales

All materials exposed at the lunar surface undergo space weathering processes. On the Moon, boulders make up only a small percentage of the exposed surface, and areas where such rocks are exposed, like central peaks, are often among the least space weathered regions identified from remote sensing data. Yet space weathered surfaces (patina) are relatively common on returned rock samples, some of which directly sample the surface of larger boulders. Because, as witness plates to lunar space weathering, rocks and boulders experience longer exposure times compared to lunar soil grains, they allow us to develop a deeper perspective on the relative importance of various weathering processes as a function of time.

Noble, S. K.↗

Nanometer X-ray Lithography

New developments for X-ray nanomachinging include pattern transfer onto non-planar surfaces coated with eletrodeposited resists using synchrotron radion X-rays through extremely high-resolution masks made by chemically assisted focused ion beam lithography.

X-rays↗

Model validation of SIM external metrology at the sub-nanometer level

In order to achieve micro-arcsecond astrometry, SIM must make measurements of various optical path lengths at the picometer level. In this regime of precision, nearly every simplifying assumption in optics must be reexamined as a potential source of systematic error. SIM makes extensive use of physics-based models to predict the form and level of systematic errors affecting instrument performance. Since many of the modeling areas represent new frontiers in optical modeling, the validation of these physical models is a significant challenge that SIM must meet. In the case of the external metrology truss, the model must account for the imperfections in the corner cubes as well as the distance measuring interferometers ("beam launchers"). This model is being validated using the Kite testbed, a 2-D metrology truss with picometer-level accuracy in displacement measurements. We present the model and the results of the model validation tests on the Kite testbed.

Kuan, Gary M.↗

Ion beam mill etch depth monitoring with nanometer-scale resolution

A method for measuring conductance of a material real-time during etching/milling includes providing a fixture having a socket for receiving the material. The socket is attached to a printed circuit board (PCB) mounted on one side of a plate that has at least one opening for providing ion beam access to the material sample. Conductive probes extend from the other side of the PCB to contact and span a target area of the material. A measurement circuit in electrical communication with the probes measures the voltage produced when a current is applied across the material sample to measure changes in electrical properties of the sample over time.

Cybart, Shane A.↗