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NASA NTRS2000

Characterization of Molybdate Conversion Coatings for Aluminum Alloys by Electrochemical Impedance Spectroscopy

Electrochemical impedance spectroscopy (EIS) was used to investigate the corrosion inhibiting properties of newly developed proprietary molybdate conversion coatings on aluminum alloy 2024-T3 under immersion in aerated 5% (w/w) NaCl. Corrosion potential and EIS measurements were gathered for six formulations of the coating at several immersion times for two weeks. Nyquist as well as Bode plots of the data were obtained. The conversion-coated alloy panels showed an increase in the corrosion potential during the first 24 hours of immersion that later subsided and approached a steady value. Corrosion potential measurements indicated that formulations A, D, and F exhibit a protective effect on aluminum 2024-T3. The EIS spectra of the conversion-coated alloy were characterized by an impedance that is higher than the impedance of the bare alloy at all the immersion times. The low frequency impedance, Z(sub lf) (determined from the value at 0.05 Hz) for the conversion-coated alloy was higher at all the immersion times than that of the bare panel. This indicates improvement of corrosion resistance with addition of the molybdate conversion coating. Scanning electron microscopy (SEM) revealed the presence of cracks in the coating and the presence of cubic crystals believed to be calcium carbonate. Energy dispersive spectroscopy (EDS) of the test panels revealed the presence of high levels of aluminum, oxygen, and calcium but did not detect the presence of molybdenum on the test panels. X-ray photoelectron spectroscopy (XPS) indicated the presence of less than 0.01 atomic percent molybdenum on the surface of the coating.

Calle, Luz Marina↗

NASA NTRSDate not supplied

The Experiment for Cryogenic Large-aperture Intensity Mapping (EXCLAIM)

Submillimeter and far-IR spectroscopy provides insight into galaxy evolution through measurement of atomic and molecular line emission. The EXperiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM) is a cryogenic balloon-borne instrument designed to carry out intensity mapping to measure the cumulative redshifted line emission from carbon monoxide and singly-ionized carbon to probe star formation in windows from the present to z=3.5. During this time, the rate of star formation dropped dramatically, while dark matter continued to cluster. Intensity mapping permits a blind and complete survey of emitting gas through statistics of cumulative brightness fluctuations. EXCLAIM achieves high sensitivity using a cryogenic telescope coupled to six integrated spectrometers with spectral resolving power R=512 and employing microwave kinetic inductance detectors. Here we summarize the status of the mission.

Maryam Rahmani↗

NASA NTRSDate not supplied

The Experiment for Cryogenic Large-aperture Intensity Mapping (EXCLAIM)

Maryam Rahmani↗

NASA NTRS1983

Laser optogalvanic spectroscopy of molecules

In laser optogalvanic (LOG) spectroscopy, a tunable laser is used to probe the spectral characteristics of atomic or molecular species within an electrical discharge in a low pressure gas. Optogalvanic signals arise when the impedance of the discharge changes in response to the absorption of laser radiation. The technique may, therefore, be referred to as impedance spectroscopy. This change in impedance may be monitored as a change in the voltage across the discharge tube. LOG spectra are recorded by scanning the wavelength of a chopped CW dye laser while monitoring the discharge voltage with a lock-in amplifier. LOG signals are obtained if the laser wavelength matches a transition in a species present in the discharge (or flame), and if the absorption of energy in the laser beam alters the impedance of the discharge. Infrared LOG spectroscopy of molecules has been demonstrated and may prove to be the most productive application in the field of optogalvanic techniques.

Webster, C. R.↗

NASA NTRS1974

Partially autoionizing states of atomic oxygen

Certain Rydberg states and an intershell transition of atomic oxygen were shown to partially autoionize, and to produce emission spectra competitive with autoionization. These states are forbidden to autoionize on the basis of LS coupling; but they were observed both in emission spectroscopy and in photoelectron spectroscopy. The results explain an unidentified structure in the 584 Angstrom He I atomic O spectrum observed by previous investigators.

Samson, J. A. R.↗

NASA NTRS1974

Oxygen and hydrogen atom concentration profiles in the premixed propane/oxygen flame

The oxygen and hydrogen free radical (atom) concentration profiles in the premixed propane/oxygen flame at 92.5% oxygen were determined using electron spin resonance (ESR) spectroscopy techniques. The ESR instrument was specially modified so that the flame can be probed for determining the oxygen and hydrogen atom population densities during the actual combustion process of propane burning in oxygen. The technique used for propane is similar to that suggested by Fristrom and Westenberg to measure the free radical concentration profiles in C-C hydrocarbon/oxygen combustion.

Downs, W. R.↗

NASA NTRS1971

Group theoretical selection rules for electron-impact spectroscopy.

Simple group theoretical principles are applied to the consideration of electron scattering off atoms and diatomic and polyatomic molecules. This approach is also used to estimate relative strengths of electron-impact-induced transitions of diatomic and polyatomic molecules.

Goddard, W. A., III↗

NASA NTRS1995

The surface properties of fluorinated polyimides exposed to VUV and atomic oxygen

The effect of atomic oxygen flux and VUV radiation alone and in combination on the surface of fluorinated polyimide films was studied using XPS spectroscopy. Exposure of fluorinated polyimides to VUV radiation alone caused no observable damage to the polymer surface, while an atomic oxygen flux resulted in substantial oxidation of the surface. On the other hand, exposure to VUV radiation and atomic oxygen in combination caused extensive oxidation of the polymer surface after only 2 minutes of exposure. The amount of oxidized carbon on the polymer surface indicated that there is aromatic ring opening oxidation. The changes in the O1s/C1s, N1s/C1s, and F1s/C1s ratios suggested that an ablative degradation process is highly favorable. A synergistic effect of VUV radiation in the presence of atomic oxygen is clearly evidenced from the XPS study. The atomic oxygen could be considered as the main factor in the degradation process of fluorinated polyimide films exposed to a low earth orbit environment.

Forsythe, John S.↗

NASA NTRS1966

New techniques in geochemical analysis

Thin layer and gas chromatography, Mossbauer and atomic absorption spectrometry, fission track analysis, X-ray fluorescence spectroscopy, and other methods employed in geochemistry

X-RAY FLUORESCENCE SPECTROSCOPY↗

NASA NTRS1974

Observation of iron-rich coating on lunar grains and a relation to low albedo

The outermost few atomic layers of lunar soil samples were studied by Auger spectroscopy and were found to contain in each case two to three times more iron than the mean bulk composition of the sample. The amount of excess iron is found to be closely correlated with the optical albedo in the manner that would be theoretically expected if the iron provided absorption centers. Crushed lunar rocks of similar mean composition, but lacking the extra iron coating of the soil grains, have a much higher albedo than most lunar soils sampled or observed on the lunar surface.

Gold, T.↗

NASA NTRS1982

XPS Study of SiO2 and the Si/SiO2 Interface

X-ray photoelectron spectroscopy (XPS) is analytical technique for understanding electronic structure of atoms close to surface in solids, in preference to bulk structure of material. Study found evidence for core-level chemical shifts arising from changes in local structural environment in amorphous SiO2 and at Si/SiO2 interface. Observed XPS spectra may be understood as sequential convolution of several functions, each with well-defined physical interpretation.

Grunthaner, F. J.↗

NASA NTRS1982

Observation of a Rydberg series of CO in the two-electron excited region

Using synchrotron radiation as a continuum background, the absorption spectrum of CO in the 380-470 A range was taken by using a double ion chamber. A Rydberg series in the 450 A (27.5 eV) region has been observed to converge to the F 2Pi, a two-electron excited state of CO(+). The series limit determined at 28.11 eV is in excellent agreement with the vertical ionization potential of the F 2Pi state measured by the high resolution photoelectron spectroscopy. A few dissociation processes leading to the productions of atomic ions and excited atomic fragments are also discussed.

Wu, C. Y. R.↗

NASA NTRS1988

Amorphous silicon carbide coatings for extreme ultraviolet optics

Amorphous silicon carbide films formed by sputtering techniques are shown to have high reflectance in the extreme ultraviolet spectral region. X-ray scattering verifies that the atomic arrangements in these films are amorphous, while Auger electron spectroscopy and Rutherford backscattering spectroscopy show that the films have composition close to stoichiometric SiC, although slightly C-rich, with low impurity levels. Reflectance vs incidence angle measurements from 24 to 1216 A were used to derive optical constants of this material, which are presented here. Additionally, the measured extreme ultraviolet efficiency of a diffraction grating overcoated with sputtered amorphous silicon carbide is presented, demonstrating the feasibility of using these films as coatings for EUV optics.

Kortright, J. B.↗

NASA NTRS1989

ESCA study of several fluorocarbon polymers exposed to atomic oxygen in low earth orbit or within or downstream from a radio-frequency oxygen plasma

The ESCA (electron spectroscopy for chemical analysis) spectra of films of Tedlar, tetrafluoroethylene-hexafluoropropylene copolymer (in the form of a Teflon FEP coating on Kapton H, i.e., Kapton F), and polytetrafluoroethylene (Teflon or Teflon TFE), exposed to atomic oxygen O(3P) either in LEO on the STS-8 Space Shuttle or within or downstream from a radio-frequency oxygen plasma, were compared. The major difference in surface chemistry of Tedlar induced by the various exposures to O(3P) was a much larger uptake of oxygen when etched either in or out of the glow of an O2 plasma than when etched in LEO. In contrast, Kapton F exhibited very little surface oxidation during any of the three different exposures to O(3P), while Teflon was scarcely oxidized.

Golub, Morton A.↗

NASA NTRS1992

Electron spectroscopy analysis

The Surface Science Laboratories at the University of Alabama in Huntsville (UAH) are equipped with x-ray photoelectron spectroscopy (XPS or ESCA) and Auger electron spectroscopy (AES) facilities. These techniques provide information from the uppermost atomic layers of a sample, and are thus truly surface sensitive. XPS provides both elemental and chemical state information without restriction on the type of material that can be analyzed. The sample is placed into an ultra high vacuum (UHV) chamber and irradiated with x-rays which cause the ejection of photoelectrons from the sample surface. Since x-rays do not normally cause charging problems or beam damage, XPS is applicable to a wide range of samples including metals, polymers, catalysts, and fibers. AES uses a beam of high energy electrons as a surface probe. Following electronic rearrangements within excited atoms by this probe, Auger electrons characteristic of each element present are emitted from the sample. The main advantage of electron induced AES is that the electron beam can be focused down to a small diameter and localized analysis can be carried out. On the rastering of this beam synchronously with a video display using established scanning electron microscopy techniques, physical images and chemical distribution maps of the surface can be produced. Thus very small features, such as electronic circuit elements or corrosion pits in metals, can be investigated. Facilities are available on both XPS and AES instruments for depth-profiling of materials, using a beam of argon ions to sputter away consecutive layers of material to reveal sub-surface (and even semi-bulk) analyses.

Gregory, John C.↗

NASA NTRS1994

Discovery of the double Doppler-shifted emission-line systems in the X-ray spectrum of SS 433

We have used the CCD X-ray spectrometers on ASCA and resolved the X-ray emission line from the jet of SS 433 both into Doppler-shifted components with two distinct velocities, and into emission from different ionization states of iron, i.e., Fe XXV and Fe XXVI. This is the first direct detection of the two Doppler shifted beams in the X-ray spectra of SS 433 and allows the radial velocity of the jet along the line of sight to be determined with an accuracy comparable to the optical spectroscopy. We also found pairs of emission lines from other atomic species, such as ionized silicon and sulfur, with the Doppler shifts consistent with each other. This confirms the origin of the X-ray emission in the high temperature plasma in the jets.

Kotani, Taro↗

NASA NTRS1997

Development of Processing Techniques for Advanced Thermal Protection Materials

Thermal Protection Materials Branch (TPMB) has been involved in various research programs to improve the properties and structural integrity of the existing aerospace high temperature materials. Specimens from various research programs were brought into the analytical laboratory for the purpose of obtaining and refining the material characterization. The analytical laboratory in TPMB has many different instruments which were utilized to determine the physical and chemical characteristics of materials. Some of the instruments that were utilized by the SJSU students are: Scanning Electron Microscopy (SEM), Energy Dispersive X-ray analysis (EDX), X-ray Diffraction Spectrometer (XRD), Fourier Transform-Infrared Spectroscopy (FTIR), Ultra Violet Spectroscopy/Visible Spectroscopy (UV/VIS), Particle Size Analyzer (PSA), and Inductively Coupled Plasma Atomic Emission Spectrometer (ICP-AES). The above mentioned analytical instruments were utilized in the material characterization process of the specimens from research programs such as: aerogel ceramics (I) and (II), X-33 Blankets, ARC-Jet specimens, QUICFIX specimens and gas permeability of lightweight ceramic ablators. In addition to analytical instruments in the analytical laboratory at TPMB, there are several on-going experiments. One particular experiment allows the measurement of permeability of ceramic ablators. From these measurements, physical characteristics of the ceramic ablators can be derived.

Selvaduray, Guna↗

NASA NTRS2001

Synthesis of ZnO:As Films Using Off-Axis Sputtering Deposition

As a novel oxide semiconductor material, ZnO is interesting for use in many applications. For fabricating electronic devices, it is important to have n- and p- type ZnO materials. Arsenic has been proven to be one of the p-type dopants for ZnO materials. However, information in studying the ZnAsO ternary compound films has been scarce. In order to investigate the morphology, structure and electrical properties of ZnAsO ternary compounds, ZnO:As films have been synthesized using off-axis sputtering deposition on various substrates including (100) Si and (0001) sapphire crystals. Films are grown under various growth conditions. ZnO:As targets with the atomic weight ratios of arsenic to zinc from 0.01 to 0.10 are used for film synthesis. The growth temperatures and pressures range from 350 to 550C and 5 to 150 mTorr, respectively. Argon to oxygen gas ratio for film growth is varied to examine the film quality as well. Film surface morphology, crystal structure, and compositions, are characterized using atomic force microscopy, x-ray diffraction, and energy dispersive spectroscopy, respectively. The compositions of target material and ZnO:As films grown under various conditions are then assessed. The electrical properties were also measured. The detail of these measurements will be discussed in the presentation.

Zhu, Shen↗