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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 199 records · Page 11
All sourcesNASA NTRSDOE OSTI
NASA NTRS2019

Goddard Modular SmallSat Architecture (GMSA) Hardware Presentation

In today's rapidly advancing technology roadmap for space applications there is an emphasis on completing missions faster and cheaper than previous large-scale missions at the National Aeronautics and Space Administration (NASA) such as the Magnetospheric Multiscale (MMS) mission. As part of this effort, focus has shifted from using mostly radiation-tolerant or radiation-hardened parts to more commercial-off-the-shelf (COTS) components for missions that can last at least one year in orbit. However, there are some portions of a spacecraft's avionics, such as the command and data handling (C&DH) system and the Electrical Power Systems (EPS) that need to have some level of predictable reliability that goes beyond the capabilities of currently available COTS parts. While there are a number of COTS components that can withstand a total ionizing dose (TID) of tens or hundreds of kilorads, there is still a great deal of concern about tolerance to and mitigation of single-event effects (SEE).

Fraction, James↗
NASA NTRS2019

Room Temperature Radiation Testing of a 500 °C Durable 4H-SiC JFET Integrated Circuit Technology

Total ionizing dose (TID) and single-event effect (SEE) room-temperature radiation test results are presented for developmental prototype 4H-SiC junction field effect transistor (JFET) semiconductor integrated circuits (ICs) that have demonstrated prolonged operation in extremely high-temperature (500 °C) environments. The devices tested demonstrated over 7 Mrad(Si) TID tolerance and no destructive SEE susceptibility.

Lauenstein, Jean-Marie↗
NASA NTRS2008

Guideline for ground radiation testing of microprocessors in the space radiation environment

The goal of this work is to develop a guideline that is applicable to processors that are potentially useful in space. Thus, the guideline does not consider very high performance processors that are intended for server or high-performance applications where very large amounts of power are tolerated to gain performance because it would be impractical to use such high-power devices in typical space applications. This guide is intended to support insertion of these microprocessors into spaceflight applications and to recommend ground test protocols. The first guideline principle that should be followed is a serious concurrent engineering approach for down selecting space-qualified microprocessors. This requires that the design engineer seek the support of a radiation effects expert who understands total ionizing dose (TID) and single-event effects (SEEs) issues for microprocessors as applied to the system in question.

Irom, Farokh↗
NASA NTRS2017

Observation of Single-Event Burnout During Inductive Switching

1A power MOSFET demonstrated destructive Single-Event Effect (SEE) during ion irradiation in a switching circuit. Further investigation showed that the inductive load causing a spike in the drain-to-source voltage (VDS) that exceeded the manufacturer’s rating for several nanoseconds was enough to allow SEB. These results indicate that SEB may occur in a very short window and flyback is critical for disciplined power supply design.

Menke, Rob↗
NASA NTRS2018

Lessons and Recommendations for Board-Level Testing with Protons

Protons with sufficiently high energy, provided in a broad field covering on the order of 0.1m2 can be used to perform board-level testing for single event effects (SEE). NASA has used this approach for board-level testing over the last 20 years. Although many difficulties inherent in SEE testing are simplified when using a board-level test, including reduced cost, the method is inherently risky because of the limited value of the collected data and the potential to make critical mistakes when performing SEE testing this way, leading to data of less value. Historically, NASA’s approach to proton board-level testing has been limited to lower criticality applications. However, with users both inside and outside NASA using this method for higher levels of mission assurance, we have put together a set of lessons and recommendations to improve the value of data collected using this method. Focus areas covered include test preparation, test execution, and interpretation of results.

Guertin, Steven M.↗
NASA NTRS2021

Single-Event Effect Testing of the ON Semiconductor BSS123 N-Channel Logic Level Enhancement Mode FET and the Vishay Si1013R P-Channel MOSFET

This study was undertaken to determine the single event effect (SEE) susceptibility of two different MOSFET components. Heavy-ion testing was conducted at the Lawrence Berkeley National Laboratory (LBNL) Berkeley Accelerator Space Effects (BASE) Facility 88” Cyclotron. Its purpose was to evaluate these devices as candidates for use on Goddard Modular SmallSat Architecture (GMSA) adapter board for the GTOSat project.

Michael J Campola↗
NASA NTRS2021

Single-Event Effect Test Report Texas Instruments DS25BR100 LVDS Buffer

This study was to determine the destructive single-event effect (SEE) susceptibility of the DS25BR100 series Low-Voltage Differential Signaling (LVDS) Buffers with Pre-emphasis and Equalization (DS25BR100, 110, and 120). The device was monitored primarily for destructive events while exposing it to a heavy ion beam at the Texas A&M University’s (TAMU) K500 Cyclotron.

Ted Wilcox↗
NASA NTRS2021

Current State of Domestic Heavy Ion Test Facilities

We present the current status of United States domestic heavy ion single-event effects (SEE) radiation test facilities, including general perspectives on near- and mid-term needs for both capacity and capabilities.

Jonathan Pellish↗
NASA NTRS2022

Mission Radiation Environment Modeling and Analysis: Avionics Trade Study for GCD Rad-Neuro Project

The two main objectives of this trade study are characterizing the mission radiation environment for multiple Design Reference Missions (DRM) and analysis of radiation effects on avionics with the goal of producing radiation tolerant Neuromorphic Computing processor chips with innovative radiation-induced fault mitigation. The NASA process for defining radiation requirements for flight avionics is applied to this domain. The effects of trapped protons and electrons in the Van Allen radiation belts predominates in Low-Earth-Orbit (LEO) and the solar wind, solar flares and Galactic Cosmic Rays (GCRs) are the dominant radiation challenge in the open space between the planets of our solar system. The nature and energy of the particles that cause circuit upset and failure is very different in the two regimes. Two results are produced from the radiation models: determining the Total Integrated Dose (TID) experienced by avionics for a given DRM and predicting the Single Event Effects (SEE) rates for avionics during high rate exposure. These tools are applied to existing semiconductors and can be used for predicting the radiation performance of future semiconductors based on early radiation testing of new devices.

Space Radiation↗
NASA NTRSDate not supplied

NAIRAS Model Updates and Improvements to the Prediction of the Ionizing Radiation Environment from the Earth's Surface to Geospace

- NAIRAS Model Description - Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) Model - Running in real-time on LaRC computer cluster since 2011, results hosted on Space Environment Technologies server/website - Running in real-time at CCMC since 2020 - Key Model Features - Global ionizing radiation environment model - Physics-based HZETRN (High Charge (Z) and Energy TRaNsport) code - Real-time inclusion of solar energetic particle (SEP) radiation - Real-time solar-magnetospheric effects on radiation (cutoff model by Kress et al. [2004, 2010]) - New/Current Model Development - Improved SEP dose nowcast and forecast - Extend to low-Earth orbit (LEO) environment - Single-Event Effects (SEE) radiation risk assessment quantities - Run-on-Request (RoR) @ CCMC

Christopher J. Mertens↗
NASA NTRSDate not supplied

NAIRAS Model Nowcasting and Forecasting of the Aviation Radiation Environment

The Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) predicts dosimetric quantities for quantifying human radiation exposure and differential/integral flux/fluence quantities for assessing single event effects (SEE) in avionic systems from galactic cosmic rays (GCR), trapped inner belt protons, and solar energetic particle (SEP) events from the Earth’s surface to the space environment. Real-time predictions of the aviation radiation environment are available at NASA Goddard Space Flight Center’s Community Coordinated Modeling Center (CCMC) integrated Space Weather Analysis (iSWA) data feeds and cygnets, and a run-on-request (RoR) capability has also been deployed at CCMC. Recent model improvements include a more accurate atmospheric ionizing radiation transport methodology and more robust and reliable SEP nowcast dose predictions. In addition, preliminary results of SEP dose forecasts are shown by coupling the University of Malaga Solar Energetic Particle (UMASEP) model of integral proton flux forecasts with the NAIRAS model. These model updates and improvements are presented, and results are shown for aircraft, high-latitude balloon, and low-Earth orbit flights during quiescent and solar-geomagnetic disturbed conditions. Model comparisons with flight measurements are also shown.

NAIRAS↗
NASA NTRS2023

Proton Testing of AMD v1202b System on Chip

Single-Event Effects (SEE) testing was previously conducted on the AMD v1200 System on Chip (SoC) at Massachusetts General Hospital’s (MGH) Francis H. Burr Proton Therapy Center on May 28, 2022, using 200-MeV protons.

Edward J Wyrwas↗
NASA NTRS2023

NAIRAS Ionizing Radiation Model: Extension from Atmosphere to Space

The Nowcast of Aerospace Ionizing RAdiation System (NAIRAS) model is a real-time, global, physics-based model originally developed to predict exposure from cosmic radiation to air travelers from both galactic and solar sources. A prototype operational NAIRAS model has provided tabular and graphical data products via its public web site for about ten years. A new version of the NAIRAS model has been developed that incorporates an extension of the model domain from the atmospheric ionizing radiation environment to the space radiation environment, with the addition of the trapped inner belt proton source and altitude-dependent and rigidity-dependent geomagnetic shielding of the galactic cosmic rays (GCR) and solar energetic particle (SEP) protons. New output products of differential and integral particle flux have been developed for the characterization of single-event effects (SEE), expanding the application of NAIRAS from human radiation exposure assessment to allowing end-users to quantify radiation environment risks to aviation and spacecraft microelectronic systems. The NAIRAS model has transitioned to prototype operations at the Community Coordinated Modeling Center (CCMC) where the model now operates in two modes: (1) real-time global predictions of the atmospheric radiation environment and (2) a run-on-request (RoR) service allowing the user to select a specific time period for the global dosimetric calculations, or to upload an aircraft, balloon, or spaceflight trajectory file to provide predictions of the dosimetric and particle flux quantities along the flight path. The new features of NAIRAS version 3.0 are described in this paper and example results of the new output products for low-Earth orbit (LEO), medium-Earth orbit (MEO), and free-space radiation environments are presented

Christopher J. Mertens↗
NASA NTRS2023

Texas Instrument DRV8881 2.5A Dual H-Bridge Motor Driver Heavy-Ion Single-Event Effects Test Report

The purpose of this test was to characterize the single-event effects (SEE) susceptibility of the Texas Instrument (TI) DRV8881 2.5A Dual H-Bridge Motor Driver. The device’s output was monitored for changes during exposure to heavy-ions at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. The main goal of testing was to test for destructive SEEs. Nondestructive SEEs were recorded during testing but not fully characterized. Testing was performed on November 9th and 11th, 2022.

Thomas A. Carstens↗
NASA NTRS2023

Single Event Effect Testing of the SSDI SFF6661 N-Channel Power MOSFET

This irradiation campaign was performed to evaluate the destructive single event effect (SEE) susceptibility of a n-channel power MOSFET from SSDI for space-based instrumentation. Testing was performed at Michigan State University’s (MSU) Facility for Rate Isotope Beams (FRIB) using an LET of 50.5 MeV·cm 2 /mg

Landen D. Ryder↗
NASA NTRSDate not supplied

Radiation Effects Considerations for Instrumentation and Control in Space Nuclear Systems

Radiation effects in electrical, electronic, electro-motive, and electro-optical (EEEE) hardware encompass a complex variety of interactions, processes, environments, and an evolving landscape of relevant hardware. Appropriately mitigating the effects of radiation in sensors, data acquisition, and control hardware is among the most significant challenges associated with deploying space nuclear power and propulsion systems. The expertise within EEEE radiation effects disciplines require working knowledge that is at least as complex and diverse as the problem itself, but that should not dissuade stakeholders and engineers in adjacent disciplines from attempting to understand the general principles associated with the problem at hand. This brief overview seeks to bring to the foreground a set of relevant topics that are of special importance for space nuclear propulsion applications that involve high rates of neutron and gamma radiation. The unique set of environments and design requirements for space nuclear systems mean that the experience and utility for methods applied to typical spaceflight hardware or terrestrial nuclear systems must not be applied naively. Forward consideration on the applicability of testing methods applied to either existing or bespoke hardware is likely to drive early decisions on system-wide radiation effects mitigation strategies, and will influence procurement requirements for providers of radiation tolerant hardware who are unlikely to have experience in this unique set of environments. Radiation hardness assurance (RHA) guidance should be adapted and emphasize the importance of hardware testing in the relevant environment. These must consider the combined effects of temperature, total ionizing dose (TID), non-ionizing/displacement damage (TNID/DD), and single event effects (SEE), and should consider the impacts of flux (rate) in addition to cumulative effects.

Radiation↗