NASA NTRS · 20210015659
Single-Event Effect Test Report Texas Instruments DS25BR100 LVDS Buffer
Abstract
This study was to determine the destructive single-event effect (SEE) susceptibility of the DS25BR100 series Low-Voltage Differential Signaling (LVDS) Buffers with Pre-emphasis and Equalization (DS25BR100, 110, and 120). The device was monitored primarily for destructive events while exposing it to a heavy ion beam at the Texas A&M University’s (TAMU) K500 Cyclotron.
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Ted Wilcox, Michael Campola, Matt Joplin. 2021-06-01. Single-Event Effect Test Report Texas Instruments DS25BR100 LVDS Buffer. https://ntrs.nasa.gov/citations/20210015659
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