Risk-Driven and Mitigation-Focused SEFI Testing of NAND Flash Devices
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Ted Wilcox↗
Engineering topics
Matt Joplin
Publications and source records attributed to Matt Joplin.
Single-Event Effect Test Report Texas Instruments DS25BR100 LVDS Buffer
This study was to determine the destructive single-event effect (SEE) susceptibility of the DS25BR100 series Low-Voltage Differential Signaling (LVDS) Buffers with Pre-emphasis and Equalization (DS25BR100, 110, and 120). The device was monitored primarily for destructive events while exposing it to a heavy ion beam at the Texas A&M University’s (TAMU) K500 Cyclotron.
Ted Wilcox↗
Single-Event Effect Test Report International Rectifier 80SCLQ060SCS Schottky Diode
This study was undertaken to determine the destructive single event effect and degradation susceptibility of the 80SCL060SCS Schottky diode. The device was monitored for destructive events and degradation in the reverse bias current during exposure to a heavy ion beam at Texas A&M University's K500 Cyclotron.
Ted Wilcox↗