NASA NTRS · 20210009916
Single-Event Effect Test Report International Rectifier 80SCLQ060SCS Schottky Diode
Abstract
This study was undertaken to determine the destructive single event effect and degradation susceptibility of the 80SCL060SCS Schottky diode. The device was monitored for destructive events and degradation in the reverse bias current during exposure to a heavy ion beam at Texas A&M University's K500 Cyclotron.
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Ted Wilcox, Michael Campola, Matt Joplin. 2020-12-08. Single-Event Effect Test Report International Rectifier 80SCLQ060SCS Schottky Diode. https://ntrs.nasa.gov/citations/20210009916
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