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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 217 records · Page 12
All sourcesNASA NTRSDOE OSTI
NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗
NASA NTRS2018

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Field Programmable Gate Array (FPGA)↗
NASA NTRS1986

Total-dose radiation effects data for semiconductor devices. 1985 Supplement. Volume 2, part B

Steady-state, total-dose radiation test data are provided in graphic format, for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. The document is in two volumes: Volume 1 provides data on diodes, bipolar transistors, field effect transistors, and miscellaneous semiconductor types, and Volume 2 (Parts A and B) provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done steady-state 2.5-MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose. All data were generated in support of NASA space programs by the JPL Radiation Effects and Testing Group (514).

Martin, K. E.↗
NASA NTRS1978

Radiative, actively cooled panel tests results

The radiative, actively cooled panel designed to withstand a uniform incident heat flux of 136 kW/sq m to a 444 K surface temperature was evaluated. The test program consisted of preliminary static thermal mechanical loading and aerothermal flow tests. Test results are briefly discussed.

Shore, C. P.↗
NASA NTRS1974

Flat plate collector performance determined experimentally with a solar simulator

The NASA is constructing a new office building at Langley Research Center that will utilize solar energy for heating and cooling. A collector technology program being conducted at Lewis will provide the basis for selecting collectors for use at Langley. The technology program includes testing collectors in an indoor facility under simulated solar radiation. Tests have been conducted on five collectors to date and performance data are presented herein.

Vernon, R. W.↗
NASA NTRS1974

Flat-plate collector performance determined experimentally with a solar simulator

The NASA is constructing a new office building at Langley Research Center that will utilize solar energy for heating and cooling. A collector technology program is described which includes testing collectors in an indoor facility under simulated solar radiation. Tests have been conducted on five collectors to date and performance data are presented. The collector performance obtained with the solar simulator will be correlated with data obtained by conducting tests outdoors at Lewis.

Vernon, R. W.↗
NASA NTRS1980

Radiation tolerance of vertical junction solar cells

Extensive radiation testing of vertical junction (VJ) solar cells demonstrated a radiation tolerance better than both planar silicon cells and at least one type of (AlGa)As-GaAs cell. Due to tradeoffs between short circuit current and open circuit voltage, the end of life (10 to the 16th power 1 MeV electrons/sq cm) maximum power point is nearly independent of bulk resistivity between 2 and 10 ohm cm, increases slightly with increasing wafer thickness between 3 and 11 mils, and increases slightly with increasing groove depth between 1 and 3 mils.

Schelnine, A.↗
NASA NTRS2010

Development of Fiber-Based Laser Systems for LISA

We present efforts on fiber-based laser systems for the LISA mission at the NASA Goddard Space Flight Center. A fiber-based system has the advantage of higher robustness against external disturbances and easier implementation of redundancies. For a master oscillator, we are developing a ring fiber laser and evaluating two commercial products, a DBR linear fiber laser and a planar-waveguide external cavity diode laser. They all have comparable performance to a traditional NPRO at LISA band. We are also performing reliability tests of a 2-W Yb fiber amplifier and radiation tests of fiber laser/amplifier components. We describe our progress to date and discuss the path to a working LISA laser system design.

Numata, Kenji↗
NASA NTRS2008

Testing guideline for single event gate rupture (SEGR) of power MOSFETs

The purpose of this document is two-fold. First, the document lists and discusses many of the issues important to understand when testing power MOSFETs. Second, the recommended approach for using radiation test data to define the device application requirements is presented. These include SEE rate calculation, data analysis, and derating guidelines. A significant amount of work has been done on the basic effects of SEB and SEGR. References are supplied where seminal work has been done on the topic at hand. The reader is urged to review the references if the testing issues or mission application at hand are complex.

Scheick, Leif↗
NASA NTRS1992

Shortcomings in ground testing, environment simulations, and performance predictions for space applications

This paper addresses the issues involved in radiation testing of devices and subsystems to obtain the data that are required to predict the performance and survivability of satellite systems for extended missions in space. The problems associated with space environmental simulations, or the lack thereof, in experiments intended to produce information to describe the degradation and behavior of parts and systems are discussed. Several types of radiation effects in semiconductor components are presented, as for example: ionization dose effects, heavy ion and proton induced Single Event Upsets (SEUs), and Single Event Transient Upsets (SETUs). Examples and illustrations of data relating to these ground testing issues are provided. The primary objective of this presentation is to alert the reader to the shortcomings, pitfalls, variabilities, and uncertainties in acquiring information to logically design electronic subsystems for use in satellites or space stations with long mission lifetimes, and to point out the weaknesses and deficiencies in the methods and procedures by which that information is obtained.

Stassinopoulos, E. G.↗
NASA NTRS1985

Parameter extraction from spaceborne MOSFETs

An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET parameters derived from JMOSFIT.

Buehler, M. G.↗
NASA NTRS2000

Spacecraft Communications System Verification Using On-Axis Near Field Measurement Techniques

Determination of the readiness of a spacecraft for launch is a critical requirement. The final assembly of all subsystems must be verified. Testing of a communications system can mostly be done using closed-circuits (cabling to/from test ports), but the final connections to the antenna require radiation tests. The Tropical Rainfall Measuring Mission (TRMM) Project used a readily available 'near-fleld on-axis' equation to predict the values to be used for comparison with those obtained in a test program. Tests were performed in a 'clean room' environment at both Goddard Space Flight Center (GSFC) and in Japan at the Tanegashima Space Center (TnSC) launch facilities. Most of the measured values agreed with the predicted values to within 0.5 dB. This demonstrates that sometimes you can use relatively simple techniques to make antenna performance measurements when use of the 'far field ranges, anechoic chambers, or precision near-field ranges' are neither available nor practical. Test data and photographs are provided.

Keating, Thomas↗