Continuing radiation evaluation of commercial-off-the-shelf devices for space applications
Radiation test results are presented for a number of commercial transistors and integrated circuits procured in both ceramic and plastic packages.
Radiation↗
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Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics
Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis.
Buehler, M. G.↗
Assembly and Integration of Superconductive Measurement Circuits for a Spaceflight Experiment
Hybrid microelectronics containing both conventional electronic components and high-temperature superconductive films have been designed, fabricated, and tested. The devices operate from room temperature to 75K and perform d.c. four-probe resistance measurements on six superconductive specimens resident on each circuit. Four of these hybrid circuits were incorporated into the Materials In Devices As Superconductors (MIDAS) spaceflight experiment and evaluated over a 90-day period on the Mir space station. Prior to launch, comprehensive testing of the flight circuits was performed to determine the effects of thermal cycling, vibration loads, and long-term operation on circuit performance. This report describes the fabrication and assembly procedures used to produce the hybrid circuits, the techniques used to integrate the circuits into the MIDAS hardware system, and the results of pre-flight evaluations which verified circuit functionality.
Wise, Stephanie A.↗
Test aspects of the JPL Viterbi decoder
The generation of test vectors and design-for-test aspects of the Jet Propulsion Laboratory (JPL) Very Large Scale Integration (VLSI) Viterbi decoder chip is discussed. Each processor integrated circuit (IC) contains over 20,000 gates. To achieve a high degree of testability, a scan architecture is employed. The logic has been partitioned so that very few test vectors are required to test the entire chip. In addition, since several blocks of logic are replicated numerous times on this chip, test vectors need only be generated for each block, rather than for the entire circuit. These unique blocks of logic have been identified and test sets generated for them. The approach employed for testing was to use pseudo-exhaustive test vectors whenever feasible. That is, each cone of logid is tested exhaustively. Using this approach, no detailed logic design or fault model is required. All faults which modify the function of a block of combinational logic are detected, such as all irredundant single and multiple stuck-at faults.
Breuer, M. A.↗
Piezoresistive stress sensors on (110) silicon wafers
Structural reliability of electronic packages has become an increasing concern for a variety of reasons including the advent of higher integrated circuit densities, power density levels, and operating temperatures. A powerful method for experimental evaluation of die stress distributions is the use of test chips incorporating integral piezoresistive sensors. In this paper, the basic equations needed for the design of stress sensors fabricated on the surface of (110) oriented silicon wafers have been presented. Several sensor rosette configurations have been explored, including the familiar three-element 0-45-90 rosette. Rosette designs have been found which minimize the necessary calibration procedures and permit more stress components to be measured. It has been established that stress sensors on the surface of (110) test chips are sensitive to four out of the six stress components at a point.
Kang, Y. L.↗
Operation of a New Half-Bridge Gate Driver for Enhancement - Mode GaN FETs, Type LM5113, Over a Wide Temperature Range
A new commercial-off-the-shelf (COTS) gate driver designed to drive both the high-side and the low-side enhancement-mode GaN FETs, National Semiconductor's type LM5113, was evaluated for operation at temperatures beyond its recommended specified limits of -40 C to +125 C. The effects of limited thermal cycling under the extended test temperature, which ranged from -194 C to +150 C, on the operation of this chip as well as restart capability at the extreme cryogenic and hot temperatures were also investigated. The driver circuit was able to maintain good operation throughout the entire test regime between -194 C and +150 C without undergoing any major changes in its outputs signals and characteristics. The limited thermal cycling performed on the device also had no effect on its performance, and the driver chip was able to successfully restart at each of the extreme temperatures of -194 C and +150 C. The plastic packaging of this device was also not affected by either the short extreme temperature exposure or the limited thermal cycling. These preliminary results indicate that this new commercial-off-the-shelf (COTS) halfbridge eGaN FET driver integrated circuit has the potential for use in space exploration missions under extreme temperature environments. Further testing is planned under long-term cycling to assess the reliability of these parts and to determine their suitability for extended use in the harsh environments of space.
Patterson, Richard↗
Documentation of Stainless Steel Lithium Circuit Test Section Design
The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005.
Godfroy, T. J.↗
Documentation of Stainless Steel Lithium Circuit Test Section Design
The Early Flight Fission-Test Facilities (EFF-TF) team was tasked by Naval Reactors Prime Contract Team (NRPCT) to design, fabricate, and test an actively pumped lithium (Li) flow circuit. This Li circuit takes advantage of work in progress at the EFF TF on a stainless steel sodium/potassium (NaK) circuit. The effort involved modifying the original stainless steel NaK circuit such that it could be operated with Li in place of NaK. This new design considered freeze/thaw issues and required the addition of an expansion tank and expansion/extrusion volumes in the circuit plumbing. Instrumentation has been specified for Li and circuit heaters have been placed throughout the design to ensure adequate operational temperatures and no uncontrolled freezing of the Li. All major components have been designed and fabricated prior to circuit redesign for Li and were not modified. Basic circuit components include: reactor segment, Li to gas heat exchanger, electromagnetic liquid metal pump, load/drain reservoir, expansion reservoir, instrumentation, and trace heaters. The reactor segment, based on a Los Alamos National Laboratory 100-kW design study with 120 fuel pins, is the only prototypic component in the circuit. However, due to earlier funding constraints, a 37-pin partial-array of the core, including the central three rings of fuel pins (pin and flow path dimensions are the same as those in the full design), was selected for fabrication and test. This Technical Publication summarizes the design and integration of the pumped liquid metal Li flow circuit as of May 1, 2005. This supplement contains drawings, analysis, and calculations
Godfroy, Thomas J.↗
The 25 kW resonant dc/dc power converter
The feasibility of processing 25-kW of power with a single, transistorized, series resonant converter stage was demonstrated by the successful design, development, fabrication, and testing of such a device which employs four Westinghouse D7ST transistors in a full-bridge configuration and operates from a 250-to-350 Vdc input bus. The unit has an overall worst-case efficiency of 93.5% at its full rated output of 1000 V and 25 A dc. A solid-state dc input circuit breaker and output-transient-current limiters are included in and integrated into the design. Full circuit details of the converter are presented along with the test data.
Robson, R. R.↗
Accurate Cold-Test Model of Helical TWT Slow-Wave Circuits
Recently, a method has been established to accurately calculate cold-test data for helical slow-wave structures using the three-dimensional (3-D) electromagnetic computer code, MAxwell's equations by the Finite Integration Algorithm (MAFIA). Cold-test parameters have been calculated for several helical traveLing-wave tube (TWT) slow-wave circuits possessing various support rod configurations, and results are presented here showing excellent agreement with experiment. The helical models include tape thickness, dielectric support shapes and material properties consistent with the actual circuits. The cold-test data from this helical model can be used as input into large-signal helical TWT interaction codes making It possible, for the first time, to design complete TWT via computer simulation.
Kory, Carol L.↗
Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface Atmospheric Conditions
Prolonged Venus surface missions (lasting months instead of hours) have proven infeasible to date in the absence of a complete suite of electronics able to function for such durations without protection from the planet’s extreme conditions of ~460 °C, ~9.3 MPa (~ 92 Earth atmospheres) chemically reactive environment. Here we report testing data from a successful two-month (60-day) operational demonstration of two 175-transistor 4H-SiC junction field effect transistor (JFET) semiconductor integrated circuits (ICs) directly exposed (no cooling and no protective chip packaging) to a high-fidelity physical and chemical reproduction of Venus surface atmospheric conditions in a test chamber. These results extend the longest reported duration of electronics operation in Venus surface atmospheric conditions almost 3-fold and were accomplished using prototype SiC JFET chips of more than 7-fold increased complexity. The demonstrated advancement marks a significant step towards realization of electronics with sufficient complexity and durability for implementing robotic landers capable of returning months of scientific data from the surface of Venus.
Integrated Circuit↗
NASA Communications Division (NASCOM) Tracking and Data Relay Satellite System (TDRSS) shuttle multiplexer-demultiplexer data system (MDM) and supporting items
The multiplexer-demultiplexer (MDM) project included the design, documentation, manufacture, and testing of three MDM Data Systems. The equipment is contained in 59 racks, and includes more than 3,000 circuit boards and 600 microprocessors. Spares, circuit card testers, a master set of programmable integrated circuits, and a program development system were included as deliverables. All three MDM's were installed, and were operationally tested. The systems performed well with no major problems. The progress and problems analysis, addresses schedule conformance, new technology, items awaiting government approval, and project conclusions are summarized. All contract modifications are described.
New, S. R.↗
Advanced control signal processor, phase 4 Completion report
Design and test results of advanced control signal processor and power supply circuits for rate integrating gyros
Towles, W. B.↗
Redundancy approaches in bubble domain memories
Fabrication of integrated circuit chips to compensate for faulty memory elements is discussed. Procedure for testing chips to determine extent of redundancy and faults is described. Mathematical model to define operation is presented. Schematic circuit diagram of test equipment is provided.
Almasi, G. S.↗
Investigation of failure mechanisms in integrated vacuum circuits
The fabrication techniques of integrated vacuum circuits are described in detail. Data obtained from a specially designed test circuit are presented. The data show that the emission observed in reverse biased devices is due to cross-talk between the devices and can be eliminated by electrostatic shielding. The lifetime of the cathodes has been improved by proper activation techniques. None of the cathodes on life test has shown any sign of failure after more than 3500 hours. Life tests of triodes show a decline of anode current by a factor of two to three after a few days. The current recovers when the large positive anode voltage (100 V) has been removed for a few hours. It is suggested that this is due to trapped charges in the sapphire substrate. Evidence of the presence of such charges is given, and a model of the charge distribution is presented consistent with the measurements. Solution of the problem associated with the decay of triode current may require proper treatment of the sapphire surface and/or changes in the deposition technique of the thin metal films.
Rosengreen, A.↗
Guidelines for SEU-Resistant Integrated Circuits
Paper presents recent results of continuing program for increasing resistance of integrated circuits to single-event upset (SEU). Results based on study of test data for heavy-ion SEU in more than 180 different types of devices. (Some devices perform identical functions but made by different processes.) Program also examines developments in mathematical models for SEU.
Nichols, D. K.↗
1990 IEEE Annual Conference on Nuclear and Space Radiation Effects, 27th, Reno, NV, July 16-20, 1990, Proceedings
Various papers on nuclear and space radiation effects are presented. The general topics addressed include: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, hardness assurance and testing techniques, single-event upset and latchup, isolation technologies, device and integrated circuit effects and hardening, spacecraft charging and electromagnetic effects.
Fleetwood, Daniel M.↗
Integration Testing of a Modular Discharge Supply for NASA's High Voltage Hall Accelerator Thruster
NASA s In-Space Propulsion Technology Program is developing a high performance Hall thruster that can fulfill the needs of future Discovery-class missions. The result of this effort is the High Voltage Hall Accelerator thruster that can operate over a power range from 0.3 to 3.5 kW and a specific impulse from 1,000 to 2,800 sec, and process 300 kg of xenon propellant. Simultaneously, a 4.0 kW discharge power supply comprised of two parallel modules was developed. These power modules use an innovative three-phase resonant topology that can efficiently supply full power to the thruster at an output voltage range of 200 to 700 V at an input voltage range of 80 to 160 V. Efficiencies as high as 95.9 percent were measured during an integration test with the NASA103M.XL thruster. The accuracy of the master/slave current sharing circuit and various thruster ignition techniques were evaluated.
Pinero, Luis R.↗