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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 271 records · Page 15

High energy density primary batteries

By the use of fractional factorials, paths of steepest ascent and direct comparison experimentation, performance characteristics of the CuF2/LiAsF6-MF/Li electrochemical system were optimized under conditions of temperature environment, discharge rate, active stand, and use of anhydrous cathodes. Two hundred ampere-hours/lb of CuF2 and 600 watt-hours/lb of CuF2 were achieved in anhydrous cells at plus 40 C and at a discharge rate of 10 ma sq cm. Electrical performance is primarily altered by temperature and discharge rate; however, other factors such as cathode water content, cathode conductor content, separator thickness, and the use of SO2 gas also have significant effects.

Horning, R. J.↗

Technological development of high energy density capacitors

A study was conducted to develop cylindrical wound metallized film capacitors rated 2 micron F 500 VDC that had energy densities greater than 0.1J/g. Polysulfone (PS) and polyvinylidene (PVF2) were selected as dielectrics. Single film PS capacitors of 0.2J/g (uncased) were made of 3.75 micron material. Single film PVF2 capacitors of 0.19J/g (uncased) were made of 6.0 micron material. Corona measurements were made at room temperature, and capacitance and dissipation factor measurements were made over the ranges 25 C to 125 C and 120 Hz to 100 kHz. Nineteen of twenty PVF2 components survived a 2500 hour dc plus ac life test. Failure analyses revealed most failures occurred at wrinkles, but some edge failures were also seen. A 0.989g case was designed. When the case was combined with the PVF2 component, a finished energy density of 0.11J/g was achieved.

Parker, R. D.↗

Technological development of cylindrical and flat shaped high energy density capacitors

Cylindrical wound metallized film capacitors rated 2 micron F 500 VDC that had an energy density greater than 0.3 J/g, and flat flexible metallized film capacitors rated at 2 micron F 500 VDC that had an energy density greater than 0.1 J/g were developed. Polysulfone, polycarbonate, and polyvinylidene fluoride (PVF2) were investigated as dielectrics for the cylindrical units. PVF2 in 6.0 micron m thickness was employed in the final components of both types. Capacitance and dissipation factor measurements were made over the range 25 C to 100 C, and 10 Hz to 10 kHz. No pre-life-test burning was performed, and six of ten cylindrical units survived a 2500 hour AC plus DC lift test. Three of the four failures were infant mortality. All but two of the flat components survived 400 hours. Finished energy densities were 0.104 J/g at 500 V and 0.200 J/g at 700 V, the energy density being limited by the availability of thin PVF2 films.

Zelik, J. A.↗

High-energy-density flat flexible capacitors

Manufacturing technique produces flat flexible capacitors of energy density greater than 0.1 J/g. Exposure of some of metalized surface of each layer provides sufficient film surface to ensure good electrical connection to each layer of capacitor.

Parker, R. D.↗

Research on high energy density capacitor materials

The Pulsed Plasma thruster is the simplest of all electric propulsion devices. It is a pulsed device which stores energy in capacitors for each pulse. The lifetimes and energy densities of these capacitors are critical parameters to the continued use of these thrusters. This report presents the result of a research effort conducted by JPL into the materials used in capacitors and the modes of failure. The dominant failure mechanism was determined to be material breakdown precipitated by heat build-up within the capacitors. The presence of unwanted gas was identified as the source of the heat. An aging phenomena was discovered in polycarbonate based capacitors. CO build-up was noted to increase with the number of times the capacitor had been discharged. Improved quality control was cited as being essential for the improvement of capacitor lifetimes.

Somoano, Robert↗