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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Design of rapidly steerable high resolution antenna array using voltage variable capacitors suitable for radio astronomy
Impedance computations for parallel plate and coaxial cylinder plasma capacitors in magnetic field
Coaxial capacitor for measuring density of fluids in both liquid and gaseous phase over wide range of temperatures and pressures
Energy storage film capacitors for pulsed plasma thrustors developed for coaxial plasma gun and pulsed arc gun
Thin film silicon monoxide capacitor vacuum deposition and intact removal from substrate to study breakdown characteristics
High vacuum approach for high dielectric constant thin film capacitor fabrication to reduce microcircuit size
Fourier analysis of amplifier commutated capacitor type integrator output signal
Destructive breakdown conduction in aluminum- silicon oxide-aluminum capacitors, discussing voltage threshold, etc
Metal-silicon nitride-silicon /MNS/ capacitor charge storage variation with temperature and time
Embedded resistors and capacitors were purchased from two technology; organic PWB and inorganic low temperature co-fire ceramic (LTCC). Small groups of each substrate were exposed to four environmental tests and several characterization tests to evaluate their performance and reliability. Even though all passive components maintained electrical performance throughout environmental testing, differences between the two technologies were observed. Environmental testing was taken beyond manufacturers' reported testing, but general not taken to failure. When possible, data was quantitatively compared to manufacturer's data.
Overview Reviewed data Caution must be taken when accelerating test conditions Data not useful to establish an acceleration model Introduction of new failure mechanism skewing results Evidence of Anti-Wear-Out De-doping of polymer Decreased capacitance Increased ESR Not dielectric breakdown Needs further investigation Further investigation into tantalum polymer capacitor technology Promising acceleration model for Manufacturer A Possibility for use in high-reliability space applications with suitable voltage derating.
The reliability of an MLCC device is the product of a time-dependent part and a time-independent part: 1) Time-dependent part is a statistical distribution; 2) Time-independent part is the reliability at t0, the initial reliability. Initial reliability depends only on how a BME MLCC is designed and processed. Similar to the way the minimum dielectric thickness ensured the long-term reliability of a PME MLCC, the initial reliability also ensures the long term-reliability of a BME MLCC. This presentation shows new discoveries regarding commonalities and differences between PME and BME capacitor technologies.
The reliability of an MLCC device is the product of a time-dependent part and a time-independent part: 1) Time-dependent part is a statistical distribution; 2) Time-independent part is the reliability at t=0, the initial reliability. Initial reliability depends only on how a BME MLCC is designed and processed. Similar to the way the minimum dielectric thickness ensured the long-term reliability of a PME MLCC, the initial reliability also ensures the long term-reliability of a BME MLCC. This presentation shows new discoveries regarding commonalities and differences between PME and BME capacitor technologies.
This presentation gives a review of recent project failures caused by cracks in ceramic capacitors and discusses deficiencies of the existing screening and qualification procedures that can reveal the propensity to cracking and effects of soldering stresses.
This work gives a comparative analysis of degradation processes, failure modes and mechanisms in MnO2 and polymer technology capacitors. Analyzed conditions include effects of vacuum and radiation, soldering (pop-corning), long-term storage and operation at high temperatures, stability at low and high temperatures, and anomalous transients. Screening and qualification procedures to assure space-grade quality of CPTCs are suggested.
This presentation gives a comparative analysis of degradation processes, failure modes and mechanisms in MnO2 and polymer technology capacitors. Analyzed conditions include effects of vacuum and radiation, soldering (pop-corning), long-term storage, operation at high temperatures, stability at low and high temperatures, and anomalous transients. Screening and qualification procedures to assure space-grade quality of CPTCs are suggested.
Burn-in (BI) and life testing (LT) are the most important reliability related elements of quality assurance for components used in space systems. This presentation discusses the need of transition from the existing approach to BI, LT, and destructive physical analysis (DPA) of COTS capacitors that is based on military specifications to an alternative approach that is based on Physics of Failure and HALT.
The overall scope of this NESC study was to identify (or develop) a tool, methodology, or process that can inspect a ceramic capacitor and consistently return repeatable grain size distribution results. It is important to note that the development of a machine learning technique was considered as an option for this study, but only if an existing automated tool was not available. This report explains why the Electron Backscatter Diffraction analysis method for grain structure and size distribution was deemed a suitable candidate for this work.