Dark Energy Survey Year 6 Results: improved mitigation of spatially varying observational systematics with masking
As photometric surveys reach unprecedented statistical precision, systematic uncertainties increasingly dominate large-scale structure probes relying on galaxy number density. Defining the final survey footprint is critical, as it excludes regions affected by artefacts or suboptimal observing conditions. For galaxy clustering, spatially varying observational systematics, such as seeing, are a leading source of bias. Template maps of contaminants are used to derive spatially dependent corrections, but extreme values may fall outside the applicability range of mitigation methods, compromising correction reliability. The complexity and accuracy of systematics modelling depend on footprint conservativeness, with aggressive masking enabling simpler, robust mitigation. We present a unified approach to define the DES Year 6 joint footprint, integrating observational systematics templates and artefact indicators that degrade mitigation performance. This removes extreme values from an initial seed footprint, leading to the final joint footprint. By evaluating the DES Year 6 lens sample MagLim++ plus plus on this footprint, we enhance the Iterative Systematics Decontamination (ISD) method, detecting non-linear systematic contamination and improving correction accuracy. While the mask's impact on clustering is less significant than systematics decontamination, it remains non-negligible, comparable to statistical uncertainties in certain w(theta) scales and redshift bins. Supporting coherent analyses of galaxy clustering and cosmic shear, the final footprint spans 4031.04 deg2, setting the basis for DES Year 6 1x2pt, 2x2pt, and 3x2pt analyses. This work highlights how targeted masking strategies optimise the balance between statistical power and systematic control in Stage-III and -IV surveys.