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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 289 records · Page 16
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NASA NTRS1985

Layered synthetic microstructures for solar EUV telescopes

The application of layered synthetic microstructures (LSMs) to figured mirrors suitable for normal incidence solar EUV telescopes is considered, and initial studies for a single mirror telescope consisting of an f/18, 200-cm focal length off-axis paraboloid demonstrate the feasibility of LSM coatings for moderate sized mirrors. Analytical studies on broadband designs comprised of five layers show a seven percent reflectance at 256 A and reflectivities of over 12 percent for wavelengths above 300 A. Deposition considerations are also discussed.

Keski-Kuha, R. A. M.↗
NASA NTRS1987

What's needed in the UV and EUV

High spectral and spatial resolution UV and EUV spectroscopy is discussed with emphasis on the spectroscopic observations that are required in order to increase the understanding of the physics of the lower transition region. The properties of the lower transition region are reviewed, and the available lower transition region plasma diagnostics are reviewed for the wavelength range between about 1150 and 2000 A. One important conclusion is that comprehensive spectroscopic coverage over a rather broad temperature range is necessary in order to observe satisfactorily small transition region structures. This is illustrated by two examples from the recent NRL Spacelab 2 HRTS experiment.

Doschek, G. A.↗
NASA NTRS1986

Calibration of photon counting imaging microchannel plate detectors for EUV astronomy

The calibration of photon counting imaging detectors for satellite based EUV astronomy is a complex process designed to ensure the validity of the data received 'in orbit'. The methods developed to accomplish calibration of microchannel plate detectors for the Extreme Ultraviolet Explorer are described and illustrated. The characterization of these detectors can be subdivided into three categories: stabilization, performance tests, and environmental tests.

Siegmund, O. H. W.↗
NASA NTRS1986

Problems and approaches to the calibration of solar EUV instrumentation in space

Accurate measurements of the Sun's extreme ultraviolet (EUV) emission are of major importance in aeronomical studies of the Earth's upper atmosphere and for studies of the Sun's outer atmosphere, where the radiation originates in the tenuous, high-temperature chromosphere and corona. Current levels of calibration accuracy of space instrumentation used to observe this radiation and accuracies desired in the future are discussed. Several suggestions are made for methods that can provide approximate recalibrations of instruments in orbit using the radiation from the Sun itself.

Neupert, Werner M.↗
NASA NTRS1987

The upper atmosphere of Uranus - EUV occultations observed by Voyager 2

EUV (52-170 nm) solar and stellar occultation observations of the Uranian atmosphere from 500 microbar to about 1 pbar, obtained with the UV spectrometer on Voyager 2 during its encounter with Uranus in January 1986, are reported. The data are presented in extensive tables and graphs and characterized in detail. The atmosphere is found to be dominated by H2 (with very small hydrocarbon mixing ratios) out to about 1.25 Uranian radii, where atomic H becomes important. Also noted are a small (relative to Jupiter and Saturn) homopause eddy-diffusion coefficient, little difference between the atmospheres of the day and night hemispheres, high temperatures (800 + or - 100 K) above about 1-10 nbar, and number densities of several hundred H/cu cm at 2 Uranian radii. The implications of the latter finding for ring dynamics and plasma populations are explored.

Herbert, Floyd↗
NASA NTRS1988

Normal incidence reflectance of ion beam deposited SiC films in the EUV

Results are presented from an experimental investigation of the normal-incidence reflectance at 58.4, 92.0, and 121.6 nm wavelength of 30- and 80-nm-thick SiC films produced by ion-beam deposition on unheated 5 x 5-cm microscope slides. The films were deposited in the 2-m evaporator described by Bradford et al. (1969) with chamber base pressure 1 microtorr, operating pressure 40 microtorr, and a 50-62-mA 750-eV Ar ion beam; the reflectance measurements were obtained in the reflector-monochromator system described by Osantowski (1974). Reflectances of over 30 percent were found at 92 and 121.6 nm, almost equal to those of polished CVD films of SiC and degrading only slightly after aging for 4 months. It is suggested that ion-beam deposition may be the best low-temperature technique for coating EUV optics for space astronomy.

Keski-Kuha, Ritva A. M.↗
NASA NTRS1988

Contamination of grazing incidence EUV mirrors - An assessment

Contamination assessment for space optical systems requires an understanding of the sensitivity of component performance, e.g. mirror reflectance, to materials deposited on the mirror surface. In a previous study, the sensitivity of typical normal incidence mirror coatings to surface deposits of generic hydrocarbons was reported. Recent activity in the development of grazing incidence telescopes for extreme ultraviolet space astronomy has stimulated the need for a similar assessment in the spectral region extending from approximately 100 A to 1000 A. The model used for analysis treats the contamination layer as a continuous thin film deposited on the mirror surface. The mirror surfaces selected for this study are opaque vacuum deposited gold and the uncoated and polished Zerodur. Scatter caused by film irregularities or particulates are not included in this assessment. Parametric evaluations at 100, 500, and 1000 A determine the sensitivity of mirror reflectance to a range of optical constants selected for the generic contaminants. This sensitivity analysis combined with the limited amount of optical data in the EUV for hydrocarbons, is used to select representative optical constants for the three wavelength regions. Reflectance versus contamination layer thickness curves are then calculated and used to determine critical thickness limits based on allowable reflectance change. Initial observations indicate that thickness limits will be highly dependent on the real part of the complex index of refraction of the contaminant film being less than 1.0. Preliminary laboratory measurements of samples contaminated with some commonly encountered hydrocarbons confirm trends indicated in the analytical studies.

Osantowski, John F.↗
NASA NTRS1988

Synchrotron radiation calibration of the EUVE variable line-spaced diffraction gratings at the NBS SURF II facility

The Extreme Ultraviolet Explorer (EUVE) has a spectrometer which utilizes variable line-spaced, plane diffraction gratings in the converging beam of a Wolter-Schwarzschild type II mirror. The gratings, microchannel plate detector, and thin film filters have been calibrated with continuum radiation provided by the NBS SURF II facility. These were calibrated in a continuum beam to find edges or other sharp spectral features in the transmission of the filters, quantum efficiency of the microchannel plate detector, and efficiency of the gratings. The details of the calibration procedure and the results of the calibration are presented.

Jelinsky, P.↗
NASA NTRS1989

True covariance simulation of the EUVE update filter

A covariance analysis of the performance and sensitivity of the attitude determination Extended Kalman Filter (EKF) used by the On Board Computer (OBC) of the Extreme Ultra Violet Explorer (EUVE) spacecraft is presented. The linearized dynamics and measurement equations of the error states are derived which constitute the truth model describing the real behavior of the systems involved. The design model used by the OBC EKF is then obtained by reducing the order of the truth model. The covariance matrix of the EKF which uses the reduced order model is not the correct covariance of the EKF estimation error. A true covariance analysis has to be carried out in order to evaluate the correct accuracy of the OBC generated estimates. The results of such analysis are presented which indicate both the performance and the sensitivity of the OBC EKF.

Bar-Itzhack, Itzhack Y.↗
NASA NTRS1990

Feasibility of using Extreme Ultraviolet Explorer (EUVE) reaction wheels to satisfy Space Infrared Telescope Facility (SIRTF) maneuver requirements

A digital computer simulation is used to determine if the extreme ultraviolet explorer (EUVE) reaction wheels can provide sufficient torque and momentum storage capability to meet the space infrared telescope facility (SIRTF) maneuver requirements. A brief description of the pointing control system (PCS) and the sensor and actuator dynamic models used in the simulation is presented. A model to represent a disturbance such as fluid sloshing is developed. Results developed with the simulation, and a discussion of these results are presented.

Lightsey, W. D.↗
NASA NTRS1989

Periodic solar EUV flux monitored near Venus

A detector sharing the orbital rate of Venus has a unique perspective on solar periodicities. Fourier analysis of the 8.6 year record of solar EUV output gathered by the Langmuir probe on Pioneer Venus Orbiter shows the influences of global oscillation modes located in the convective envelope and in the radiative interior. Seven of the eight lowest angular harmonic r-mode familes are detected by their rotation rates which differ almost unmeasurably from ideal theoretical values. This determines a mean sidereal rotation rate for the envelope of 457.9 + or - 2.0 nHz which corresponds to a period of 25.3 days. Many frequencies are aliased at + or - 106 nHz by modulation from the lowest angular harmonic r-mode in the envelope.

Wolff, Charles L.↗
NASA NTRS1990

Sounding rocket measurement of the absolute solar EUV flux utilizing a silicon photodiode

A newly developed stable and high quantum efficiency silicon photodiode was used to obtain an accurate measurement of the integrated absolute magnitude of the solar extreme UV photon flux in the spectral region between 50 and 800 A. The adjusted daily 10.7-cm solar radio flux and sunspot number were 168.4 and 121, respectively. The unattenuated absolute value of the solar EUV flux at 1 AU in the specified wavelength region was 6.81 x 10 to the 10th photons/sq cm per s. Based on a nominal probable error of 7 percent for National Institute of Standards and Technology detector efficiency measurements in the 50- to 500-A region (5 percent on longer wavelength measurements between 500 and 1216 A), and based on experimental errors associated with the present rocket instrumentation and analysis, a conservative total error estimate of about 14 percent is assigned to the absolute integral solar flux obtained.

Ogawa, H. S.↗
NASA NTRS1990

True covariance simulation of the EUVE update filter

This paper presents a covariance analysis of the performance and sensitivity of the attitude determination Extended Kalman Filter (EKF) used by the On Board Computer (OBC) of the Extreme Ultra Violet Explorer (EUVE) spacecraft. The linearized dynamics and measurement equations of the error states are used in formulating the 'truth model' describing the real behavior of the systems involved. The 'design model' used by the OBC EKF is then obtained by reducing the order of the truth model. The covariance matrix of the EKF which uses the reduced order model is not the correct covariance of the EKF estimation error. A 'true covariance analysis' has to be carried out in order to evaluate the correct accuracy of the OBC generated estimates. The results of such analysis are presented which indicate both the performance and the sensitivity of the OBC EKF.

Bar-Itzhack, I. Y.↗
NASA NTRS1990

A high resolution echelle spectrometer for soft X-ray and EUV astronomy

A new design is presented for high resolution spectroscopy from 80 to 400 A. This design employs grazing incidence optics and variable line-spaced gratings to achieve high resolution. Unlike some previously proposed EUV echelles, this design employs straight groove planar gratings, which are a well-proven, easily manufactured design. The instrument delivers a peak resolution of 7500 and a peak effective area of 3 sq cm.

Green, James↗
NASA NTRS1992

The development and test of a deformable diffraction grating for a stigmatic EUV spectroheliometer

The objectives were to address currently unanswered fundamental questions concerning the fine scale structure of the chromosphere, transition region, and corona. The unique characteristics of the spectroheliometer was used in combination with plasma diagnostic techniques to study the temperature, density, and velocity structures of specific features in the solar outer atmosphere. A unified understanding was sought of the interplay between the time dependent geometry of the magnetic field structure and the associated flows of mass and energy, the key to which lies in the smallest spatial scales that are unobservable with current EUV instruments. Toroidal diffraction gratings were fabricated and tested by a new technique using an elastically deformable substrate. The toroidal diffraction gratings was procured and tested to be used for the evaluation of the Multi-Anode Microchannel Array (MAMA) detector systems for the Solar Ultraviolet Measurements of Emitted Radiation (SUMER) and UV Coronagraph Spectrometer (UVCS) instruments on the SOHO mission.

Timothy, J. Gethyn↗
NASA NTRS1990

True covariance simulation of the EUVE (extreme ultra violet explorer) update filter

This paper presents a covariance analysis of the performance and sensitivity of the attitude determination Extended Kalman Filter (EKF) used by the onboard computer (OBC) of the Extreme Ultra Violet Explorer (EUVE) spacecraft. The linearized dynamics and measurement equations of the error states are used in formulating the 'truth model' describing the order of the systems involved. The 'design model' used by the OBC EKF is then obtained by reducing the order of the truth model. The covariance matrix of the EKF which uses the reduced order model is not the correct covariance of the EKF estimation error. A 'true covariance analysis' has to be carried out in order to evaluate the correct accuracy of the OBC generated estimates. The results of such analysis are presented which indicate both the performance and the sensitivity of the OBC EKF.

Bar-Itzhack, I. Y.↗
NASA NTRS1991

Optical coating technology for the EUV

Advances in optical coating and materials technology are one of the key motivators for the development of missions such as the Far Ultraviolet Spectroscopic Explorer recently selected by NASA for an Explorer class mission in the mid 1990's. The performance of a range of candidate coatings are reviewed for normal-incidence and glancing-incidence applications, and attention is given to strengths and problem areas for their use in space. The importance of recent developments in multilayer films, chemical-vapor deposited SiC (CVD-SiC) mirrors, and SiC films are discussed in the context of EUV instrumentation design. For example, the choice of optical coatings is a design driver for the selection of the average glancing angle for the FUSE telescope, and impacts efficiency, short-wavelength cut-off, and physical size.

Osantowski, J. F.↗
NASA NTRS1991

The Berkeley EUV spectrometer for ORFEUS

A novel EUV spectrometer is presented for the ORFEUS-SPAS mission. It uses a set of four varied line-space spherical diffraction gratings to obtain high-resolution spectra of point sources at wavelengths between 390 and 1200 A. The spectra are recorded with two detector units, each containing curved-surface microchannel plates and a delay-line anode-readout system. An independent optical system detects the image of the source in the entrance aperture and tracks the source as it drifts during an observation, enabling a reconstruction of the spectra postflight. The overall system performance is discussed and illustrated by synthetic spectra.

Hurwitz, M.↗