Search NASA⌕ Search

SEARCH · Search NASA

Results for “Auger”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 307 records · Page 17
All sourcesNASA NTRSDOE OSTI
NASA NTRS1978

Secondary electron emission properties of conducting surfaces for use in multistage depressed collectors

An Auger spectrometer in ultrahigh vacuum was used to measure the secondary emission properties of a number of candidate collector-materials including beryllium, carbon, (soot and pyrolytic graphite), copper, titanium carbide and tantalum. The advantage of the technique used is that the surface chemical constituents could be determined just before the secondary emission characteristics of the surface were measured. Pyrolytic graphite roughened by sputter etching showed the most favorable results for depressed collector use.

Forman, R.↗
NASA NTRS1978

Braze alloy spreading on steel

Scanning electron microscopy (SEM) and Auger electron microscopy (AEM) were employed to observe elemental surface decomposition resulting from the brazing of a copper-treated steel. Two types of steel were used for the study, stainless steel (treated with a eutectic silver-copper alloy), and low-carbon steel (treated with pure copper). Attention is given to oxygen partial pressure during the processes; a low enough pressure (8 x 10 to the -5th torr) was found to totally inhibit the spreading of the filler material at a fixed heating cycle. With both types of steel, copper treatment enhanced even spreading at a decreased temperature.

Siewert, T. A.↗
NASA NTRS1978

The co-adsorption of copper and oxygen on a tungsten 100 plane-type surface

The coadsorption of Cu on O2 and a W 100 plane-type surface is studied by Auger electron spectroscopy, thermal desorption, low energy electron diffraction and by work function change measurements. It is shown that the presence of Cu on the surface initially decreases the sticking coefficient of O2. For longer oxygen exposures and for higher adsorption temperatures, the coverage of preadsorbed oxygen reaches values larger than those on the clean surface for the same O2 exposure. Except at the highest values and temperatures of the coverage of preadsorbed oxygen, the sticking coefficient for copper is unity and is independent of the oxygen coverage in the range studied. Coadsorption at room temperatures does not produce any long range order while coadsorption at elevated temperature leads to ordered structures. The saturation coverage of the two dimensional coadsorbate at 800 K is given by a relation. The work function is a complicated function of the coverage of preadsorbed oxygen and the coverage of preadsorbed Cu and is determined predominantly by the temperature at which oxygen is adsorbed. At high temperatures the sequence of adsorption has no influence, in contrast to the room temperature behavior.

Bauer, E.↗
NASA NTRS1977

An XPS /ESCA/ study of lunar surface alteration profiles

We describe several important potential applications of surface analyses in planetology, and discuss some fundamental questions pertinent to the use of X-ray photoemission spectroscopy XPS or Auger electron spectroscopy AES to study complex powder samples. It appears that in addition to specific studies of surface chemistry, XPS may be able to provide useful major element analyses for all elements except hydrogen and perhaps helium and lithium. We provide data on the chemical changes associated with sputtering of a synthetic lunar glass. The surface is depleted in Si and enriched in Ca and Ti with Fe remaining nearly constant in parallel with changes observed during thermal volatilization. No Fe reduction was observed. Composition profiles obtained by sputtering 15301 fines suggest that surface alterations and reduced Fe are confined largely to depths of a few 100 A.

Housley, R. M.↗
NASA NTRS1978

Research on lunar materials

Abstracts of 14 research reports relating to investigations of lunar samples are presented. The principal topics covered include: (1) optical properties of surface and core samples; (2) chemical composition of the surface layers of lunar grains: Auger electron spectroscopy of lunar soil and ground rock samples; (3) high frequency electrical properties of lunar soil and rock samples and their relevance for the interpretation of lunar radar observations; (4) the electrostatic dust transport process; (5) secondary electron emission characteristics of lunar soil samples and their relevance to the dust transportation process; (6) grain size distribution in surface soil and core samples; and (7) the optical and chemical effects of simulated solar wind (2keV proton and a particle radiation) on lunar material.

Gold, T.↗
NASA NTRS1979

Friction and transfer of copper, silver, and gold to iron in the presence of various adsorbed surface films

Sliding friction experiments were conducted with the noble metals copper, silver, and gold and two binary alloys of these metals contacting iron in the presence of various adsorbates including, oxygen, methyl mercaptan, and methyl chloride. A pin on disk specimen configuration was used with a load of 100 grams, sliding velocity of 60 mm/min; at 25 C with the surfaces saturated with the adsorbates. Auger emission spectroscopy was used to monitor surface films. Results of the experiments indicate that friction and transfer characteristics are highly specific with respect to both the noble metal and surface film present. With all three metals and films transfer of the noble metal to iron occurred very rapidly. With all metals and films transfer of the noble metal to iron continuously increased with repeated passes except for silver and copper sliding on iron sulfide.

Buckley, D. H.↗
NASA NTRS1978

Study program to develop and evaluate die and container materials for the growth of silicon ribbons

Initial sessile drop experiments on SiC, Si3N4 and A1N were conducted. Very promising results were achieved on both SiC and Si3N4 where minimal penetration of these CNTD coatings by molten silicon was observed. More detailed characterization of the CNTD microstructures was accomplished as well as X-ray characterization of the third and fourth candidate materials system sets (i.e. A1N and altered Si3N4). Polished sections of post sessile drop specimens were also prepared and evaluated. The techniques of full scale crucible hot pressing were developed and die grinding development was initiated. The apparatus for measurement of oxygen partial pressure was reconstructed and calibrated. The sessile drop temperature measurement procedure was calibrated for absorption by the pyrex view-port and additional Auger electron analysis was performed at the interface of molten silicon with CNTD Si3N4 and A1N.

Source record↗
NASA NTRS1979

Lunar sample analysis

The surface composition of two samples from the highly shocked, glass-coated lunar basalt (12054) and from four glass-coated fragments from the 1-2 mm (14161) fines were examined by X-ray photoemission spectroscopy to determine whether the agglutination process itself is responsible for the difference between their surface and bulk compositions. Auger electron spectroscopy of glass balls from the 15425 and 74001 fines were analyzed to understand the nature, extent, and behavior of volatile phases associated with lunar volcanism. Initial results indicate that (1) volatiles, in the outer few atomic layers sampled, vary considerably from ball to ball; (2) variability over the surface of individual balls is smaller; (3) the dominant volatiles on the balls are S and Zn; and (4) other volatiles commonly observed are P, Cl, and K.

Housley, R. M.↗
NASA NTRS1979

A fundamental approach to adhesion: Synthesis, surface analysis, thermodynamics and mechanics

Adherend surfaces and fractography were studied using electron spectroscopy for chemical analysis and scanning electron microscopy/energy dispersive analysis of X-rays. In addition, Auger Electron Spectroscopy with depth profiling capability was used. It is shown that contamination of adhesion systems plays an important role not only in determining initial bond strengths but also in the durability of adhesive bonds. It is concluded that the analytical techniques used to characterize and monitor such contamination.

Chen, W.↗
NASA NTRS1979

Study of the Effects of Impurities on the Properties of Silicon Materials and Performance of Silicon Solar Cell

Numerical solutions were obtained from the exact one dimensional transmission line circuit model to study the following effects on the terrestrial performance of silicon solar cells: interband Auger recombination; surface recombination at the contact interfaces; enhanced metallic impurity solubility; diffusion profiles; and defect-impurity recombination centers. Thermal recombination parameters of titanium impurity in silicon were estimated from recent experimental data. Based on those parameters, computer model calculations showed that titanium concentration must be kept below 6x10 to the 12th power Ti/cu cm in order to achieve 16% AM1 efficiency in a silicon solar cell of 250 micrometers thick and 1.5 ohm-cm resistivity.

Sah, C. T.↗
NASA NTRS1979

Heavily doped transparent-emitter regions in junction solar cells, diodes, and transistors

The paper presents an analytical treatment of transparent-emitter devices, particularly solar cells, that is more complete than previously available treatments. The proposed approach includes the effects of bandgap narrowing, Fermi-Dirac statistics, built-in field due to impurity profile, and a finite surface recombination velocity at the emitter surface. It is demonstrated that the transparent-emitter model can predict experimental values of Voc observed on n(plus)-p thin diffused junction silicon solar cells made on low-resistivity (0.1 ohm-cm) substrates. A test is included for the self-consistent validity of the transparent-emitter model. This test compares the calculated transit time of minority carriers across the emitter with the Auger-impact minority-carrier lifetime within the emitter region.

Shibib, M. A.↗
NASA NTRS1981

Integrated material-surface analyzer

These 10 surface-analysis tests can be run without breaking vacuum: secondary-ion mass spectroscopy, ion-scattering spectroscopy, electron-stimulated desorption, residual-gas analysis, auger electron spectroscopy, x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, characteristic-electron energy-loss spectroscopy, scanning electron microscope, scanning low-energy electron probe. Quadruple mass spectrometer, used in first 4 tests, serves as electron transfer lens in last 6 tests.

Grunthaner, F. J.↗
NASA NTRS1979

Catalysts for electrochemical generation of oxygen

Several aspects of the electrolytic evolution of oxygen for use in life support systems are analyzed including kinetic studies of various metal and nonmetal electrode materials, the formation of underpotential films on electrodes, and electrode surface morphology and the use of single crystal metals. In order to investigate the role of surface morphology to electrochemical reactions, a low energy electron diffraction and an Auger electron spectrometer are combined with an electrochemical thin-layer cell allowing initial characterization of the surface, reaction run, and then a comparative surface analysis.

Hagans, P.↗
NASA NTRS1979

Study program to develop and evaluate die and container materials for the growth of silicon ribbons

The development and evaluation of proprietary coatings of pure silicon carbide, silicon nitride, and aluminum nitride on less pure hot pressed substrates of the respective ceramic materials, is described. Silicon sessile drop experiments were performed on coated test specimens under controlled oxygen partial pressure. Prior to testing, X-ray diffraction and SEM characterization was performed. The reaction interfaces were characterized after testing with optical and scanning electron microscopy and Auger electron spectroscopy. Increasing the oxygen partial pressure was found to increase the molten silicon contact angle, apparently because adsorbed oxygen lowers the solid-vapor interfacial free energy. It was also found that adsorbed oxygen increased the degree of attack of molten silicon upon the chemical vapor deposited coatings. Cost projections show that reasonably priced, coated, molten silicon resistant refractory material shapes are obtainable.

Addington, L. A.↗
NASA NTRS1980

Optimization of solar cells for air mass zero operation and study of solar cells at high temperatures, phase 4

The Pd contact to GaAs was studied using backscattering, Auger analysis, and sheet resistance measurements. Several metallurgical phases were present at low temperatures, but PdGa was the dominant phase in samples annealed at 500 C. Ti/Pd/Ag contacts appeared to have the lowest contact resistance. Etchback epitaxy (EBE) was compared to saturated melt epitaxy (SME) method of growing liquid phase epitaxial layers. The SME method resulted in a lower density of Ga microdroplets in the grown layer, although the best solar cells were made by the EBE method. Photoluminescence was developed as a tool for contactless analysis of GaAs cells. Efficiencies of over 8 percent were measured at 250 C.

Hovel, H. J.↗
NASA NTRS1979

Metal-dielectric interactions

There is a wide variety of situations wherein metals are in solid state contact with dielectric materials. The paper reviews some of the factors that influence solid state interactions for metals in contact with dielectric surfaces. Since surfaces play an important part in these reactions, the use of analytical tools in characterizing surfaces is discussed. Adhesion, friction, and wear are utilized as indicators of the nature of interfacial bonding between metals and dielectrics can be effectively determined with adhesion and friction force measurements. Films present on the surface, such as oxygen or water vapor, markedly alter adhesive bond strength which in turn affects friction force and interfacial fracture when attempts are made to separate the contact regions. Analytical surface tools such as the field ion microscope, Auger emission spectroscopy, and X-ray photoelectron spectroscopy are very effective in providing insight into the effect of contact on the surfaces of metals and dielectrics.

Buckley, D. H.↗
NASA NTRS1979

XPS and SAM studies of the surface chemistry of lunar impact glasses including 12054

We report and discuss quantitative X-ray photoemission (XPS) analyses of mm size areas and qualitative scanning Auger microprobe (SAM) analyses of micron size areas on the surfaces of impact glass coatings found on fragments in the 14161 coarse fines and on the top surface, and a reentrant crack surface of rock 12054. The data suggest that some segregation occurs during impact glass formation leading to surface enrichments in Si and depletions in Mg, Al, Ca, and Ti. The magnitude of the effect appears fairly small, although the complexity of the surfaces severely complicates the data analysis. Because of the complexity of the surfaces, both XPS and SAM data were essential. A search for direct evidence of either solar wind sputter erosion or vapor deposition on the exposed top surface of 12054 provided interesting results which we cannot yet fully interpret. Both this surface and the surface from the re-entrant crack showed enrichments of more than a factor of two in Fe with respect to the bulk.

Housley, R. M.↗
NASA NTRS1980

The role of cesium suboxides in low-work-function surface layers studied by X-ray photoelectron spectroscopy - Ag-O-Cs

The oxidation of cesium on silver substrates has been studied using photoyield measurements and X-ray photoelectron spectroscopy. The occurrence of two O1s peaks in the core-level spectrum at 527.5 and 531.5-eV binding energy for cesium and oxygen exposures giving the optimum photoyield proves that two oxides of cesium exist in high-photoyield surfaces, and not Cs2O alone as previously thought. From the shape and position of the cesium peaks and the Auger parameter, the assignment of the O1s peaks at 527.5- and 531.5-eV binding energies to oxygen in Cs2O and Cs11O3, respectively, can be made. Hence the total cesium-oxygen layer is a mixed phase consisting of Cs2O + Cs11O3, approximately 20-40 A thick.

Yang, S.-J.↗