The application of trend surface analysis to a portion of the Apollo 15 X-ray fluorescence data
X-ray fluorescence data for 8 and 16 second time integrals gathered by Apollo 15 in circum lunar orbit were analyzed to determine the capability for chemical mapping of relatively small lunar features in a portion of Tranquillitatis and Serenitatis basins. Spatial mapping using trend surface analysis demonstrated that a useable signal could be extracted from Al/Si intensity ratios calculated for 8 second time spans. Reliability of the Al/Si ratio was enhanced when 16 second data were compiled using a sliding average technique. Residual anomalies from the trend surface mapping were identified and correlated with relatively small lunar surface features.