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We present the challenges that arise when using redundant clock domains due to their clock-skew. Radiation data show that a singular clock domain (DTMR) provides an improved TMR methodology for SRAM-based FPGAs over redundant clocks.
We present the challenges that arise when using redundant clock domains due to their clock-skew. Heavy-ion radiation data show that a singular clock domain (DTMR) provides an improved TMR methodology for SRAM-based FPGAs over redundant clocks.
We present the challenges that arise when using redundant clock domains due to their time-skew. Radiation data show that a singular clock domain provides an improved triple modular redundant (TMR) scheme over redundant clocks.
We present updates to the conventional methodology of triple modular redundancy (TMR) insertion as it pertains to clock domain crossings (CDCs). Three types of TMR schemes and their suggested corresponding CDC revisions are discussed.
This report presents 2019 LBNL SEE data and compares previous Texas A&M data to LBNL SEE DUT responses.
Published data on the processors sensitivites with respect to SEU is generally obtained from radiation ground testing during which the program is executed by the DUT consists in the sequential inspection of each of the processor memory cells accessible to the user, through the execution of a suitable instruction sequence. In such programs, so-called static tests, typically considered memory cells are general-purpose registers, special registers (program counter, stack pointer...) and internal memory. Nevertheless, the register use and duty cycle of the final application will be very different, including using instructions no in the static tests and disturbing other potential SEU targets. The ideal would be the use of the final application program for the radiation ground testing, but generally this program is either unknown or unavailable when the qualification testing is performed on candidate circuits to space projects.
Many papers have presented models for estimating proton SEU cross sections from heavy-ion test data, but all rigorous treatments to date are based on the sensitive volume (SV) model for charge collection.
Single-event transients are produced in linearintegrated circuits when they are exposed to heavy ions or protons, and those transients can be a significant problem for electronic circuits in spacecraft.
An NESC Technical Bulletin captures critical knowledge in the form of new engineering information or best practices in a one-page format that have resulted from NESC independent testing, analysis, and assessments. This document contains all NESC Technical Bulletins from 2007 through 2023.
Earth has an intrinsic magnetic field. Most people know this, because they use the magnetized needle of a compass to locate the cardinal directions north, east, south, and west. Most people don’t realize however, that Earth’s magnetic field extends well out into space where it meets, combines, and interacts with the Sun’s much stronger magnetic field. The interactions happen because the Sun sends out a steady stream of mostly protons and electrons in all directions along its magnetic field -- the solar wind. The Sun also produces continuous light emissions in infrared to ultraviolet to X-ray, in addition to eruptive emissions of X-rays and bulk ionized gas, called flares and coronal mass ejections. The ionizing radiation from the Sun striking our upper atmosphere creates a layer of ionized gas that leads to our own outflowing ionized gas, called plasma, along Earth’s magnetic field lines. The Sun’s outflowing solar wind and coronal mass ejections, together with its large magnetic field, drive strong responses inside Earth’s magnetic and plasma system. Together with cosmic radiation, these processes in the space environment are called Space Weather. That term includes the responses Earth’s magnetized plasma system has to these external drivers, which cause dangerous conditions for astronauts and satellites in space, as well as to us and our systems in the atmosphere and on the ground. This lecture is intended to make you aware of the risks and lead you to a basic awareness of the processes going on in our near-Earth space environment.
Spacecraft electronic are affected by the space radiation environment. Among the different types of radiation effects that can affect spacecraft electronics is the single event transient (SET). The space environment is responsible for many of the single event transients which can upset the performance of the spacecraft avionics hardware. In this chapter we first explore the origins of single event transients, then explore the modeling of a single event transient in digital and analog circuit. The chapter also addresses the concept of crosstalk that could develop among digital circuits in the present of a SET event. The chapter also provides a discussion of SET hardening. We then provide a discussion concerning propagation of a single event transient event at the local, subsystem, and system level in a spacecraft using two different models, one of the models developed by the author, known as the state transition model. The final goal of the chapter is to provide a qualitatively methodology for assessing single event transients and its effects so that spacecraft avionics engineers can develop either hardware or software countermeasures in their designs. SET is not a form of electromagnetic interference (EMI) in its origin, but semantically SET is very similar to EMI because they are both caused a current source not previously accounted for. SET has the same effects as EMI and it can cause interference problems in electronic circuits via multiple coupling mechanisms similar to EMI, and therefore makes such circuits incompatible.
We report on TID and SEE tests of multi-level and higher density flash memories. Stand-by currents and functionality tests were used to characterize the response of radiation-induced failures. The radiation-induced failures can be categorized as followings: SEU read errors during irradiation, stuck-bit read errors verified post-irradiation, write errors, erase failures, multiple upsets, and single-event latch up.
We present results for the single-event effect response of commercial production-level resistive random access memories. We found that the resistive memory arrays are immune to heavy ion-induced upsets. However, the devices were susceptible to single-event functional interrupts, due to upsets from the control circuits. The intrinsic radiation tolerant nature of resistive memory makes the technology an attractive consideration for future space applications.
We present a test methodology for estimating system error rates of Field Programmable Gate Arrays (FPGAs) mitigated with Triple Modular Redundancy (TMR). The test methodology is founded in a mathematical model, which is also presented. Accelerator data from 90 nm Xilins Military/Aerospace grade FPGA are shown to fit the model. Fault injection (FI) results are discussed and related to the test data. Design implementation and the corresponding impact of multiple bit upset (MBU) are also discussed.
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Heavy ion single-event measurements on 128Gb Micron Technology single-level NAND flash memory are reported. Two single event effect (SEE) phenomena were investigated: single bit upsets (SBUs) and single effect functional interrupts (SEFIs).
Heavy ion single-event measurements on 128Gb Micron Technology single-level NAND flash memory are reported. Two single event effect (SEE) phenomena were investigated: single bit upsets (SBUs) and single effect functional interrupts (SEFIs).
Solar energetic particles (SEPs) penetrate deep into the geospace and the Earth's atmosphere, initiating nuclear and chemical reactions. These reactions produce secondary hadrons, leptons, and photons, posing radiation hazards at commercial aviation altitudes, particularly during high-latitude flights. During solar particle events, protons with energies above 10 MeV can reach below 100 km altitude, causing ionization that disrupts HF communication and navigation in polar regions. Galactic Cosmic Rays (GCRs) and Solar Energetic Particles (SEPs) pose radiation risks to satellites, astronauts, and ground infrastructure. High-energy particles can lead to single-event effects in spacecraft electronics, such as upsets, latch-ups, and burnouts. These particles also interact with the Earth's atmosphere, generating ionization and secondary particles like hadrons, leptons, and photons, creating hazards for astronauts, especially during extravehicular activities. The work presented in the paper is focused on characterizing the SEP population in geospace in the altitude range starting from that of LEO through MEO and GEO, and up to the magnetopause accounting for the realistic geomagnetic field. The dynamics of SEPs are studied during quiet and geomagnetically active times using Monte Carlo simulations. The paper discusses the variability of the SEP population in geospace in response to geomagnetic activity. The former manifests in the temporal trapping of SEPs in geospace and the suppression of rigidity cutoff during geomagnetic storms.