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Results for “Accelerated Life Testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Highly accelerated life testing (HALT): A review from a statistical perspective

Despite its use in one form or another for at least four decades, HALT and related techniques [e.g., highly accelerated-stress screening (HASS) and stress audits (HASA)] are not well understood within the statistical community and remain controversial. This largely reflects a conflict in motivation between engineers, testing under harsh conditions to discover and eliminate failure modes, and statisticians, taking a more cautious approach to develop quantitative estimates of parameters such as mean time between failures (MTBF). Here, this review article will clarify HALT concepts and methods and explain where it fits within the universe of methods that involve the application of accelerating factors to compress the time required to evaluate or enhance product reliability. A major distinction is between methods such as HALT, a high-stress test-analyze-fix-test iterative process directed at improving reliability by discovering and fixing weak points in a design, and quantitative accelerated life testing (QALT), whose goal is the estimation of product life for a fixed design. We discuss methods such as physics of failure that offer some hope of bridging the gap between the qualitative nature of HALT, and purely quantitative statistical methods. We present a variety of engineering applications of HALT including metal fatigue, piping and pressure vessels, structural damage, radiation damage, and rotating machinery. We also discuss potential synergies between HALT and QALT, such as rapid identification, through HALT, of failure modes requiring quantitative analysis. For further study, extensive references to the applicable literature are provided as well as an appendix that describes related methods.

97 MATHEMATICS AND COMPUTING↗
NASA NTRS1976

Accelerated test techniques for micro-circuits: Evaluation of high temperature (473 k - 573 K) accelerated life test techniques as effective microcircuit screening methods

The application of high temperature accelerated test techniques was shown to be an effective method of microcircuit defect screening. Comprehensive microcircuit evaluations and a series of high temperature (473 K to 573 K) life tests demonstrated that a freak or early failure population of surface contaminated devices could be completely screened in thirty two hours of test at an ambient temperature of 523 K. Equivalent screening at 398 K, as prescribed by current Military and NASA specifications, would have required in excess of 1,500 hours of test. All testing was accomplished with a Texas Instruments' 54L10, low power triple-3 input NAND gate manufactured with a titanium- tungsten (Ti-W), Gold (Au) metallization system. A number of design and/or manufacturing anomalies were also noted with the Ti-W, Au metallization system. Further study of the exact nature and cause(s) of these anomalies is recommended prior to the use of microcircuits with Ti-W, Au metallization in long life/high reliability applications. Photomicrographs of tested circuits are included.

Johnson, G. M.↗
NASA NTRS1976

Voltage stress effects on microcircuit accelerated life test failure rates

The applicability of Arrhenius and Eyring reaction rate models for describing microcircuit aging characteristics as a function of junction temperature and applied voltage was evaluated. The results of a matrix of accelerated life tests with a single metal oxide semiconductor microcircuit operated at six different combinations of temperature and voltage were used to evaluate the models. A total of 450 devices from two different lots were tested at ambient temperatures between 200 C and 250 C and applied voltages between 5 Vdc and 15 Vdc. A statistical analysis of the surface related failure data resulted in bimodal failure distributions comprising two lognormal distributions; a 'freak' distribution observed early in time, and a 'main' distribution observed later in time. The Arrhenius model was shown to provide a good description of device aging as a function of temperature at a fixed voltage. The Eyring model also appeared to provide a reasonable description of main distribution device aging as a function of temperature and voltage. Circuit diagrams are shown.

Johnson, G. M.↗
NASA NTRS1975

Accelerated life test of sputtering and anode deposit spalling in a small mercury ion thruster

Tantalum and molybdenum sputtered from discharge chamber components during operation of a 5 centimeter diameter mercury ion thruster adhered much more strongly to coarsely grit blasted anode surfaces than to standard surfaces. Spalling of the sputtered coating did occur from a coarse screen anode surface but only in flakes less than a mesh unit long. The results were obtained in a 200 hour accelerated life test conducted at an elevated discharge potential of 64.6 volts. The test approximately reproduced the major sputter erosion and deposition effects that occur under normal operation but at approximately 75 times the normal rate. No discharge chamber component suffered sufficient erosion in the test to threaten its structural integrity or further serviceability. The test indicated that the use of tantalum-surfaced discharge chamber components in conjunction with a fine wire screen anode surface should cure the problems of sputter erosion and sputtered deposits spalling in long term operation of small mercury ion thrusters.

Power, J. L.↗
DOE OSTI2022

Characterization and Accelerated Life Testing of a New Solid Oxide Electrolysis Cell

The project aims to develop mechanistic degradation models that realistically predict long-term Solid Oxide Electrolysis Cell (SOEC) durability, using input data from accelerated electrochemical life testing combined with quantitative microstructural and microchemical evaluation. A promising SOEC type will be further developed. The understanding achieved by combining experimental results and theory will be used to guide improvements in long-term SOEC durability, and validate that this technology can reach DOE H 2 production cost and durability targets. Planned outcomes include: (1) new experimental accelerated testing data on SOEC degradation at the oxygen electrode, fuel electrode, and electrolyte; (2) predictive theory of degradation developed based on the accelerated test data; (3) new electrode materials and processing methods that minimize degradation rate; (4) determination of the impact of SOEC electrolyte thickness and electrode composition/microstructure on performance and degradation; (5) determination of the operating conditions where degradation is minimized; and (6) validation of degradation models for extrapolating accelerated test data to predict long-term durability.

08 HYDROGEN↗
NASA NTRS1977

Accelerated life tests of specimen heat pipe from Communication Technology Satellite (CTS) project

A gas-loaded variable conductance heat pipe of stainless steel with methanol working fluid identical to one now on the CTS satellite was life tested in the laboratory at accelerated conditions for 14 200 hours, equivalent to about 70 000 hours at flight conditions. The noncondensible gas inventory increased about 20 percent over the original charge. The observed gas increase is estimated to increase operating temperature by about 2.2 C, insufficient to harm the electronic gear cooled by the heat pipes in the satellite. Tests of maximum heat input against evaporator elevation agree well with the manufacturer's predictions.

Tower, L. K.↗
NASA NTRS2023

An Accelerated Life Testing Dataset for Lithium-Ion Batteries With Constant and Variable Loading Conditions

The dataset repository is organized into three main folders, each containing one group of life cycled battery packs. Within each folder individual battery packs own their dedicated csv file for continuous data logging, which are named with their respective battery pack number. The folders are named: - regular_alt_batteries: Containing one csv file for each battery pack cycled at the same load level or load range throughout lifetime - recommissioned_batteries: Containing one csv file for each battery pack cycled at different load levels at varying life stages - second_life_batteries: Containing one csv file for each second life battery pack cycled at constant current througout the second life

Li-ion Battery↗
DOE OSTI2016

High Efficiency Water Heating Technology Development Final Report. Part I, Lab/Field Performance Evaluation and Accelerated Life Testing of a Hybrid Electric Heat Pump Water Heater (HPWH)

DOE has supported efforts for many years with the objective of getting a water heater that uses heat pump technology (aka a heat pump water heater or HPWH) successfully on the residential equipment market. The most recent previous effort (1999-2002) produced a product that performed very well in ORNL-led accelerated durability and field tests. The commercial partner for this effort, Enviromaster International (EMI), introduced the product to the market under the trade name Watter$aver in 2002 but ceased production in 2005 due to low sales. A combination of high sales price and lack of any significant infrastructure for service after the sale were the principal reasons for the failure of this effort. What was needed for market success was a commercial partner with the manufacturing and market distribution capability necessary to allow economies of scale to lead to a viable unit price together with a strong customer service infrastructure. General Electric certainly meets these requirements, and knowing of ORNL s expertise in this area, approached ORNL with the proposal to partner in a CRADA to produce a high efficiency electric water heater. A CRADA with GE was initiated early in Fiscal Year, 2008. GE initially named its product the Hybrid Electric Water Heater (HEWH).

32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATI↗
NASA NTRS1979

Accelerated life testing effects on CMOS microcircuit characteristics

Modifications and additions to the present process of making CMOS microcircuits which are designed to provide protective layers on the chip to guard against moisture and contaminants were investigated. High and low temperature Si3N4 protective layers were tested on the CMOS microcircuits and no conclusive improvements in device reliability characteristics were evidenced.

Source record↗
NASA NTRS1984

RCA SATCOM Battery in Orbit Performance Update and Accelerated Life Test Results

No significant degradation of nickel cadmium battery performance in SATCOM F1 and F2 after almost 8 and 7-3/4 years in orbit was shown. Battery minimum discharge voltage data are presented for these spacecraft. In addition, 2 groups of nickel cadmium cells which are representative of those in orbit are undergoing real time eclipse-reduced suntime cycling in the laboratory. These groups of cells, which are being cycled at a maximum of 53% and 62% depth of discharge (based on actual capacity), have completed 14 and 15 eclipse seasons, respectively. Data for these groups of cells are presented and are compared with the in-orbit battery data.

Gaston, S. J.↗
NASA NTRS1996

Neural Network Models of Simple Mechanical Systems Illustrating the Feasibility of Accelerated Life Testing

A complete evaluation of the tribological characteristics of a given material/mechanical system is a time-consuming operation since the friction and wear process is extremely systems sensitive. As a result, experimental designs (i.e., Latin Square, Taguchi) have been implemented in an attempt to not only reduce the total number of experimental combinations needed to fully characterize a material/mechanical system, but also to acquire life data for a system without having to perform an actual life test. Unfortunately, these experimental designs still require a great deal of experimental testing and the output does not always produce meaningful information. In order to further reduce the amount of experimental testing required, this study employs a computer neural network model to investigate different material/mechanical systems. The work focuses on the modeling of the wear behavior, while showing the feasibility of using neural networks to predict life data. The model is capable of defining which input variables will influence the tribological behavior of the particular material/mechanical system being studied based on the specifications of the overall system.

Fusaro, Robert L.↗
NASA NTRS2000

Earth Scanner Bearing Accelerated Life Test

The Moderate Resolution Imaging Spectrometer (MODIS) optical instrument for NASA Goddard will measure biological and physical processes on the Earth's surface and in the lower atmosphere. A key component of the instrument is an extremely accurate scan mirror motor/encoder assembly. Of prime concern in the performance and reliability of the scan motor/encoder is bearing selection and lubrication. This paper describes life testing of the bearings and lubrication selected for the program.

Brian J Dietz↗