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Results for “Acceleration stress”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 37 records · Page 2
All sourcesNASA NTRSDOE OSTI
DOE OSTI2021

UV-Fluorescence Imaging of Silicon PV Modules After Outdoor Aging and Accelerated Stress Testing

Fast, non-destructive, outdoor-compatible methods for photovoltaic module characterization are essential for monitoring module quality without disrupting energy production. UV-fluorescence (UVF) imaging of the encapsulant layer can be used for crack detection in the field. We show that UVF patterns vary widely between modules and types of applied stress. We propose that combining accelerated stress testing (e.g. thermal cycling and damp heat) with field investigations can help build understanding of different types of UVF, which are formed and subsequently quenched at varying rates. Ultimately, such understanding could enable estimating when cracks were formed.

41 EE - Solar Energy Technologies Office (EE-4S)↗
NASA NTRS1979

Accelerated stress testing of terrestrial solar cells

A program to investigate the reliability characteristics of unencapsulated low-cost terrestrial solar cells using accelerated stress testing is described. Reliability (or parametric degradation) factors appropriate to the cell technologies and use conditions were studied and a series of accelerated stress tests was synthesized. An electrical measurement procedure and a data analysis and management system was derived, and stress test fixturing and material flow procedures were set up after consideration was given to the number of cells to be stress tested and measured and the nature of the information to be obtained from the process. Selected results and conclusions are presented.

Prince, J. L.↗
DOE OSTI2020

Advancing reliability assessments of photovoltaic modules and materials using combined-accelerated stress testing

Previously undiscovered failure modes in photovoltaic (PV) modules continue to emerge in field installations despite passing protocols for design qualification and quality assurance. Failure to detect these modes prior to widespread use could be attributed to the limitations of present-day standard accelerated stress tests (ASTs), which are primarily designed to identify known degradation or failure modes at the time of development by applying simultaneous or sequential stress factors (usually two at most). Here, we introduce an accelerated testing method known as the combined-accelerated stress test (C-AST), which simultaneously combines multiple stress factors of the natural environment. Simultaneous combination of multiple stress factors allows for improved identification of failure modes with better ability to detect modes not known a priori. A demonstration experiment was conducted that reproduced the field-observed cracking of polyamide- (PA-) and polyvinylidene fluoride (PVDF)–based backsheet films, a failure mode that was not detected by current design qualification and quality assurance testing requirements. In this work, a two-phase testing protocol was implemented. The first cycle (“Tropical”) is a predominantly high-humidity and high-temperature test designed to replicate harsh tropical climates. The second cycle (“Multi-season”) was designed to replicate drier and more temperate conditions found in continental or desert climates. Testing was conducted on 2 × 2-cell crystalline-silicon cell miniature modules constructed with both ultraviolet (UV)–transmitting and UV-blocking encapsulants. Cracking failures were observed within a cumulative 120 days of the Tropical condition for one of the PA-based backsheets and after 84 days of Tropical cycle followed by 42 days of the Multi-season cycle for the PVDF-based backsheet, which are both consistent with failures seen in fielded modules. In addition to backsheet cracking, degradation modes were observed including solder/interconnect fatigue, various light-induced degradation modes, backsheet delamination, discoloration, corrosion, and cell cracking. The ability to simultaneously apply multiple stress factors may allow many of the test sequences within the standardized design qualification procedure to be performed using a single test setup.

14 SOLAR ENERGY↗
DOE OSTI2024

Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods

In this work, we examine the use of high-order tensor decompositions to analyze degradation pathways emerging from accelerated stress testing of silicon photovoltaic (PV) modules. Matrix-based decompositions are powerful tools for studying two-dimensional data arrays and form the foundation of a host of classical data analysis techniques. Tensors are high-order extrapolations of matrices that are able to account for more parameter dimensions, and a variety of tensor decomposition methods have been developed that similarly seek to extend insights from matrix decompositions to higher dimensions. Applying and interpreting tensor decomposition methods to sequences of PV module image data, we seek to uncover and isolate different degradation modes occurring from accelerated stress testing procedures. Further, we consider the contributions of different modes to PV module performance degradations.

data analysis↗
NASA NTRS1980

Investigation of reliability attributes and accelerated stress factors on terrestrial solar cells

Three tasks were undertaken to investigate reliability attributes of terrestrial solar cells: (1) a study of the electrical behavior of cells in the second (reverse) quadrant; (2) the accelerated stress testing of three new state-of-the-art cells; and (3) the continued bias-temperature testing of four block 2 type silicon cells at 78 C and 135 C. Electrical characteristics measured in the second quadrant were determined to be a function of the cell's thermal behavior with breakdown depending on the initiation of localized heating. This implied that high breakdown cells may be more fault tolerant when forced to operate in the second quadrant, a result contrary to conventional thinking. The accelerated stress tests used in the first (power) quadrant were bias-temperature, bias-temperature-humidity, temperature-humidity, thermal shock, and thermal cycle. The new type cells measured included an EFG cell, a polycrystalline cell, and a Czochralski cell. Significant differences in the response to the various tests were observed between cell types. A microprocessed controlled, short interval solar cell tester was designed and construction initiated on a prototype.

Lathrop, J. W.↗
NASA NTRS1985

Accelerated stress testing of amorphous silicon solar cells

A technique for performing accelerated stress tests of large-area thin a-Si solar cells is presented. A computer-controlled short-interval test system employing low-cost ac-powered ELH illumination and a simulated a-Si reference cell (seven individually bandpass-filtered zero-biased crystalline PIN photodiodes) calibrated to the response of an a-Si control cell is described and illustrated with flow diagrams, drawings, and graphs. Preliminary results indicate that while most tests of a program developed for c-Si cells are applicable to a-Si cells, spurious degradation may appear in a-Si cells tested at temperatures above 130 C.

Stoddard, W. G.↗
NASA NTRS1979

Engineering Area Investigation of Reliability Attributes and Accelerated Stress Factors on Terrestrial Solar Cells

Results obtained include the definition of a simplified stress test schedule for terrestrial solar cells based on the work performed during the first program year, and the design and fabrication of improved jigs and fixtures for electrical measurement and stress testing. Implementation of these advanced techniques for accelerated stress testing is underway on three solar cell types. In addition, review of the literature on second quadrant phenomena was begun and some preliminary second-quadrant electrical measurements were performed. Results obtained at the first down time for 75 C B-T testing and biased and unbiased T-H pressure cooker testing of type F cells showed little or no degradation in electrical parameters. Significant physical effects (large solder bubbles) were noted for type F cells subjected to the pressure cooker stress test.

Lathrop, J. W.↗
DOE OSTI2022

Electrochemical characterization of evolving ionomer/electrocatalyst interactions throughout accelerated stress tests

Here, the degradation of polymer electrolyte membrane fuel cells (PEMFCs) catalyst layers used for heavy-duty vehicles was examined using a catalyst-specific accelerated stress test (AST). High surface area carbon supported dispersed Pt (Pt/HSC), annealed Pt (a-Pt/HSC) and PtCo (PtCo/HSC) alloy catalysts were examined over the course of 90,000 cycles by measuring changes in mass activity, O 2 transport resistance, electrochemical active surface area (ECSA), catalyst accessibility and ionomer-electrocatalyst interactions. Compared to a-Pt/HSC and Pt/HSC catalyst, the PtCo/HSC showed better initial mass activity, a larger initial mass transport loss, and faster degradation after the first 30k AST cycles, as a large portion of Co leached out during potential cycling. Pt/HSC showed higher initial performance relative to a-Pt/HSC but had faster degradation. STEM characterizations show that the ECSA losses are largely related to Pt dissolution resulting in either catalyst particle growth via the Ostwald ripening mechanism or redeposition in the membrane. Catalyst accessibility measurements showed decreased RH sensitivity for all three samples, while CO impedance measurements revealed a decrease in both Pt-water and carbon-water interactions. This implies that, Pt is either preferentially redepositing on the exterior of the carbon support, or that the ionomer is undergoing morphological changes enabling the enhanced intrusion of mesopores.

25 ENERGY STORAGE↗
DOE OSTI2021

Towards validation of combined-accelerated stress testing through failure analysis of polyamide-based photovoltaic backsheets

Abstract Novel methods for advancing reliability testing of photovoltaic (PV) modules and materials have recently been developed. Combined-accelerated stress testing (C-AST) is one such method which has demonstrated reliable reproduction of some field-failures which were not reproducible by standard certification tests. To increase confidence and assist in the development of C-AST, and other new testing protocols, it is important to validate that the failure modes observed and mechanisms induced are representative of those observed in the field, and not the product of unrealistic stress conditions. Here we outline a method using appropriate materials characterization and modelling to validate the failure mechanisms induced in C-AST such that we can increase confidence in the test protocol. The method is demonstrated by applying it to a known cracking failure of a specific polyamide (PA)-based backsheet material. We found that the failure of the PA-based backsheet was a result of a combination of stress factors. Photo-oxidation from ultra-violet (UV) radiation exposure caused a reduction in fracture toughness, which ultimately lead to the cracking failure. We show that the chemical and structural changes observed in the backsheet following C-AST aging were also observed in field-aged samples. These results increase confidence that the conditions applied in C-AST are representative of the field and demonstrates our approach to validating the failure mechanisms induced.

14 SOLAR ENERGY↗
DOE OSTI2024

Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods

The photovoltaic (PV) industry is simultaneously targeting long warranties and new materials/designs for high-energy-yield modules, requiring an advanced methodology to forecast long-term durability of products with un-proven materials combinations. Extended, sequential, and combined stress testing methods are gaining popularity for assessing durability of PV modules/materials beyond the early-stage mortalities. Importantly, multiple degradation mechanisms can proceed simultaneously, and their separate contributions to the overall power loss should ideally be quantified. This work examines the use of data-driven tools towards developing a strategy for faster learning cycles in accelerated stress testing.

accelerated stress testing↗
DOE OSTI2020

Durability evaluation of a Fe–N–C catalyst in polymer electrolyte fuel cell environment via accelerated stress tests

In this work, an “atomically-dispersed” iron-nitrogen-carbon (Fe–N–C) catalyst was used to provide a systematic comparison of platinum group metal (PGM)-free electrocatalyst degradation as a function of accelerated stress tests (ASTs) in an acidic polymer electrolyte fuel cell (PEFC). It was determined that the majority of catalyst degradation was caused by cell operation in presence of O 2 . In contrast, potential cycling of the Fe–N–C-containing cathode under inert atmosphere over typical PEFC cathode operation from 0.95 to 0.6 V had little to no effect. The increase in kinetic overpotential is shown to be the major source of the PEFC performance decrease during the ASTs. These results continue to showcase the need for development of robust PGM-free electrocatalysts in concert with improved electrochemical performance.

25 ENERGY STORAGE↗
DOE OSTI2022

Evaluation of bifacial module technologies with combined–accelerated stress testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.

14 SOLAR ENERGY↗
DOE OSTI2023

Examining Light-Induced Degradation with Combined-Accelerated Stress Testing

While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).

combined-accelerated stress testing↗
DOE OSTI2021

Towards Validation of Advanced Accelerated Stress Testing Protocols through Failure Analysis and Materials Characterization

As the lifetime of photovoltaic modules increases toward the goal of 50 years, accelerated stress testing is critical to assessing the viability of newer, improved, and often cheaper materials in the field. However, the validation of accelerated testing to reproduce field failure has remained elusive. The recent developments of more advanced stress testing protocols utilizing sequential and combined stressors have provided another opportunity for validation. Using a suite of mechanical, chemical, and structural characterization methods we report the development of our approach using a known bad backsheet “AAA.” We then apply this approach to PVDF-based backsheets to further confirm the generalizability of this approach. The outcome of this work is two-fold: (1) validation of advanced accelerated testing protocols which will enable the prediction of field failures in new materials, and (2) deeper insights into the degradation mechanisms observed through the extensive characterization allowing for improved materials engineering and development.

accelerated aging↗